skip to main content
Idioma:
Refinado por: autor: Tovey, N remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
Material Type:
Livro 		Adicionar ao Meu Espaço

Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks

David H. Pye, Kenneth Boggs, Sam Tovey, N. Keith Krinsley Jr, Sam Boggs; David H Krinsley; Kenneth Pye; N. Keith Tovey; Sam Boggs

Cambridge Cambridge University Press 1998

Acesso online. A biblioteca também possui exemplares impressos.

Personalize Seus Resultados

  1. Editar

Refine Search Results

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.