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The impact of advanced analytics and data accuracy on operational performance: A contingent resource based theory (RBT) perspective
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The impact of advanced analytics and data accuracy on operational performance: A contingent resource based theory (RBT) perspective

Chae, Bongsug (Kevin) ; Yang, Chenlung ; Olson, David ; Sheu, Chwen

Decision Support Systems, 2014-03, Vol.59, p.119-126 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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On Average Performance and Stability of Economic Model Predictive Control
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On Average Performance and Stability of Economic Model Predictive Control

Angeli, D. ; Amrit, R. ; Rawlings, J. B.

IEEE transactions on automatic control, 2012-07, Vol.57 (7), p.1615-1626 [Periódico revisado por pares]

New York, NY: IEEE

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3
The Difficulty in Designing Shewhart X̄ and X Control Charts with Estimated Parameters
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The Difficulty in Designing Shewhart X̄ and X Control Charts with Estimated Parameters

Saleh, Nesma A. ; Mahmoud, Mahmoud A. ; Keefe, Matthew J. ; Woodall, William H.

Journal of quality technology, 2015-04, Vol.47 (2), p.127-138 [Periódico revisado por pares]

Milwaukee: Taylor & Francis

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Run-sum control charts for monitoring the coefficient of variation
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Run-sum control charts for monitoring the coefficient of variation

Teoh, W.L. ; Khoo, Michael B.C. ; Castagliola, Philippe ; Yeong, W.C. ; Teh, S.Y.

European journal of operational research, 2017-02, Vol.257 (1), p.144-158 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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5
An Overview of Phase I Analysis for Process Improvement and Monitoring
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An Overview of Phase I Analysis for Process Improvement and Monitoring

Jones-Farmer, L. Allison ; Woodall, William H. ; Steiner, Stefan H. ; Champ, Charles W.

Journal of quality technology, 2014-07, Vol.46 (3), p.265-280 [Periódico revisado por pares]

Milwaukee: Taylor & Francis

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Some Current Directions in the Theory and Application of Statistical Process Monitoring
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Some Current Directions in the Theory and Application of Statistical Process Monitoring

Woodall, William H. ; Montgomery, Douglas C.

Journal of quality technology, 2014-01, Vol.46 (1), p.78-94 [Periódico revisado por pares]

Milwaukee: Taylor & Francis

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Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook
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Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook

Yugma, Claude ; Blue, Jakey ; Dauzère-Pérès, Stéphane ; Obeid, Ali

Journal of scheduling, 2015-04, Vol.18 (2), p.195-205 [Periódico revisado por pares]

Boston: Springer US

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8
Iterative Distributed Model Predictive Control of Nonlinear Systems: Handling Asynchronous, Delayed Measurements
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Iterative Distributed Model Predictive Control of Nonlinear Systems: Handling Asynchronous, Delayed Measurements

Jinfeng Liu ; Xianzhong Chen ; Muñoz de la Pena, David ; Christofides, P. D.

IEEE transactions on automatic control, 2012-02, Vol.57 (2), p.528-534 [Periódico revisado por pares]

New York, NY: IEEE

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9
Distributed Receding Horizon Control of Dynamically Coupled Nonlinear Systems
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Distributed Receding Horizon Control of Dynamically Coupled Nonlinear Systems

Dunbar, W.B.

IEEE transactions on automatic control, 2007-07, Vol.52 (7), p.1249-1263 [Periódico revisado por pares]

New York, NY: IEEE

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10
Generalized Reconstruction-Based Contributions for Output-Relevant Fault Diagnosis With Application to the Tennessee Eastman Process
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Generalized Reconstruction-Based Contributions for Output-Relevant Fault Diagnosis With Application to the Tennessee Eastman Process

Gang Li ; Alcala, C. F. ; Qin, S. J. ; Donghua Zhou

IEEE transactions on control systems technology, 2011-09, Vol.19 (5), p.1114-1127 [Periódico revisado por pares]

New York, NY: IEEE

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