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Material Type: Artigo
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Multiresolution hierarchical content-based image retrieval of paleontology imagesLandre, Jerome ; Truchetet, FredericProceedings of SPIE, 2003-01, Vol.SPIE-5266, p.75-83Texto completo disponível |
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Material Type: Artigo
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A wavelet representation of multivalued imagesScheunders, PaulProceedings of SPIE, 2003-01, Vol.SPIE-5266, p.203-215Texto completo disponível |
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Material Type: Artigo
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Segmentation of blurred objects using wavelet transform: application to x-ray imagesBarat, Cecile S ; Ducottet, Christophe ; Bilgot, Anne ; Desbat, LaurentProceedings of SPIE, 2003-01, Vol.SPIE-5266, p.191-202Texto completo disponível |
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Material Type: Artigo
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Estimation of anisotropic blur for the restoration of confocal imagesRooms, Filip ; Philips, Wilfried ; van Oostveldt, PatrickProceedings of SPIE, 2003-01, Vol.SPIE-5266, p.9-17Texto completo disponível |
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Material Type: Artigo
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Wavelet-based image decomposition by variational functionalsDaubechies, Ingrid ; Teschke, GerdProceedings of SPIE, 2003-01, Vol.SPIE-5266, p.94-105Texto completo disponível |
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Material Type: Artigo
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Multiscale statistical image models and Bayesian methodsPizurica, Aleksandra ; Philips, WilfriedProceedings of SPIE, 2003-01, Vol.SPIE-5266, p.60-74Texto completo disponível |
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Material Type: Artigo
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Block-based adaptive lifting schemes for multiband image compressionMasmoudi, Hela ; Benazza-Benyahia, Amel ; Pesquet, Jean-ChristopheProceedings of SPIE, 2003-10, Vol.SPIE-5266, p.118-128Texto completo disponível |
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Material Type: Artigo
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Wavelet applied to computer vision in astrophysicsBijaoui, Albert ; Slezak, Eric ; Traina, MyriamProceedings of SPIE, 2003-10, Vol.SPIE-5266, p.1-8Texto completo disponível |
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Material Type: Artigo
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Performances of a specific denoising wavelet process for high-resolution gamma imagingPousse, Annie ; Dornier, Christophe ; Parmentier, Michel ; Kastler, Bruno ; Chavanelle, JeromeProceedings of SPIE, 2003-01, Vol.SPIE-5266, p.18-29Texto completo disponível |
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Material Type: Artigo
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Comparison of texture features for segmentation of patterned wafersBourgeat, Pierrick ; Meriaudeau, Fabrice ; Tobin, Kenneth W ; Gorria, PatrickProceedings of SPIE, 2003-01, Vol.SPIE-5266, p.179-190Texto completo disponível |