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Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST
Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST
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Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST

Wang, Senling ; Aono, Tomoki ; Higami, Yoshinobu ; Takahashi, Hiroshi ; Iwata, Hiroyuki ; Maeda, Yoichi ; Matsushima, Jun

2018 IEEE 27th Asian Test Symposium (ATS), 2018, p.155-160

IEEE

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Accurate microarchitecture-level fault modeling for studying hardware faults
Accurate microarchitecture-level fault modeling for studying hardware faults
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Accurate microarchitecture-level fault modeling for studying hardware faults

Man-Lap Li ; Ramachandran, P. ; Karpuzcu, U.R. ; Hari, S. ; Adve, S.V.

2009 IEEE 15th International Symposium on High Performance Computer Architecture, 2009, p.105-116

IEEE

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3
A Distributed Bayesian Algorithm for data fault detection in wireless sensor networks
A Distributed Bayesian Algorithm for data fault detection in wireless sensor networks
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A Distributed Bayesian Algorithm for data fault detection in wireless sensor networks

Hao Yuan ; Xiaoxia Zhao ; Liyang Yu

2015 International Conference on Information Networking (ICOIN), 2015, p.63-68

IEEE

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4
PMSM Current Sensor FDI Based on DC Link Current Estimation
PMSM Current Sensor FDI Based on DC Link Current Estimation
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PMSM Current Sensor FDI Based on DC Link Current Estimation

Li, Haibo ; Qian, Yi ; Asgarpoor, Sohrab ; Sharif, Hamid

2018 IEEE 88th Vehicular Technology Conference (VTC-Fall), 2018, p.1-5

IEEE

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5
Incorporating varying test costs and fault severities into test case prioritization
Incorporating varying test costs and fault severities into test case prioritization
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Incorporating varying test costs and fault severities into test case prioritization

Elbaum, S. ; Malishevsky, A. ; Rothermel, G.

Proceedings of the 23rd International Conference on Software Engineering. ICSE 2001, 2001, p.329-338

IEEE

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6
Detection of Stator Shorted-Turns Faults in Induction Machine using DC-Centered Periodogram
Detection of Stator Shorted-Turns Faults in Induction Machine using DC-Centered Periodogram
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Detection of Stator Shorted-Turns Faults in Induction Machine using DC-Centered Periodogram

Imoru, OdunAyo ; Bhaskar, MArun ; Jimoh, Adisa A ; Hamam, Yskandar ; Abe, Bolanle T ; Tsado, Jacob

Lecture notes in engineering and computer science, 2017, Vol.2229/2230, p.376

Hong Kong: International Association of Engineers

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Fault-Tolerant Reversible Circuits
Fault-Tolerant Reversible Circuits
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Fault-Tolerant Reversible Circuits

Parhami, B.

2006 Fortieth Asilomar Conference on Signals, Systems and Computers, 2006, p.1726-1729

IEEE

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8
DC Arc-Fault Detection in PV Systems Using Multistage Morphological Fault Detection Algorithm
DC Arc-Fault Detection in PV Systems Using Multistage Morphological Fault Detection Algorithm
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DC Arc-Fault Detection in PV Systems Using Multistage Morphological Fault Detection Algorithm

Kavi, Moses ; Mishra, Yateendra ; Vilathgamuwa, Mahinda

IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, 2018, p.1746-1751

IEEE

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Detection and classification of transmission line faults based on unsupervised feature learning and convolutional sparse autoencoder
Detection and classification of transmission line faults based on unsupervised feature learning and convolutional sparse autoencoder
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Detection and classification of transmission line faults based on unsupervised feature learning and convolutional sparse autoencoder

Chen, Kunjin ; Hu, Jun ; He, Jinliang

2017 IEEE Power & Energy Society General Meeting, 2017, p.1-1

IEEE

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10
On the Comparison Between the Protection Coordination and Digital Modular Protection for Grid-Connected Battery Storage Systems
On the Comparison Between the Protection Coordination and Digital Modular Protection for Grid-Connected Battery Storage Systems
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On the Comparison Between the Protection Coordination and Digital Modular Protection for Grid-Connected Battery Storage Systems

Saleh, S. A. ; Richard, C. ; St. Onge, X. F. ; Meng, J. ; Castillo-Guerra, E.

2018 IEEE Industry Applications Society Annual Meeting (IAS), 2018, p.1-14

IEEE

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