Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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DeepLocalize: Fault Localization for Deep Neural NetworksWardat, Mohammad ; Le, Wei ; Rajan, Hridesh2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.251-262IEEETexto completo disponível |
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2 |
Material Type: Artigo
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The Secret Life of Software Vulnerabilities: A Large-Scale Empirical StudyIannone, Emanuele ; Guadagni, Roberta ; Ferrucci, Filomena ; De Lucia, Andrea ; Palomba, FabioIEEE transactions on software engineering, 2023-01, Vol.49 (1), p.44-63 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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MCMAS: an open-source model checker for the verification of multi-agent systemsLomuscio, Alessio ; Qu, Hongyang ; Raimondi, FrancoInternational journal on software tools for technology transfer, 2017-02, Vol.19 (1), p.9-30 [Periódico revisado por pares]Berlin/Heidelberg: Springer Berlin HeidelbergTexto completo disponível |
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4 |
Material Type: Artigo
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A Comprehensive Investigation of the Role of Imbalanced Learning for Software Defect PredictionSong, Qinbao ; Guo, Yuchen ; Shepperd, MartinIEEE transactions on software engineering, 2019-12, Vol.45 (12), p.1253-1269 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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5 |
Material Type: Artigo
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The Effectiveness of Supervised Machine Learning Algorithms in Predicting Software RefactoringAniche, Mauricio ; Maziero, Erick ; Durelli, Rafael ; Durelli, Vinicius H. S.IEEE transactions on software engineering, 2022-04, Vol.48 (4), p.1432-1450 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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Parallel Algorithms for Testing Finite State Machines:Generating UIO SequencesHierons, Robert M. ; Turker, Uraz CengizIEEE transactions on software engineering, 2016-11, Vol.42 (11), p.1077-1091 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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7 |
Material Type: Artigo
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An Empirical Study of Model-Agnostic Techniques for Defect Prediction ModelsJiarpakdee, Jirayus ; Tantithamthavorn, Chakkrit Kla ; Dam, Hoa Khanh ; Grundy, JohnIEEE transactions on software engineering, 2022-01, Vol.48 (1), p.166-185 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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Uppaal SMC tutorialDavid, Alexandre ; Larsen, Kim G. ; Legay, Axel ; Mikučionis, Marius ; Poulsen, Danny BøgstedInternational journal on software tools for technology transfer, 2015-08, Vol.17 (4), p.397-415 [Periódico revisado por pares]Berlin/Heidelberg: Springer Berlin HeidelbergTexto completo disponível |
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9 |
Material Type: Artigo
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On the use of many quality attributes for software refactoring: a many-objective search-based software engineering approachMkaouer, Mohamed Wiem ; Kessentini, Marouane ; Bechikh, Slim ; Ó Cinnéide, Mel ; Deb, KalyanmoyEmpirical software engineering : an international journal, 2016-12, Vol.21 (6), p.2503-2545 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
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10 |
Material Type: Artigo
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Comparing and experimenting machine learning techniques for code smell detectionArcelli Fontana, Francesca ; Mäntylä, Mika V. ; Zanoni, Marco ; Marino, AlessandroEmpirical software engineering : an international journal, 2016-06, Vol.21 (3), p.1143-1191 [Periódico revisado por pares]New York: Springer USTexto completo disponível |