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Refinado por: Base de dados/Biblioteca: IEEE Electronic Library (IEL) Conference Proceedings remover
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Uncertainty-Aware CNNs for Depth Completion: Uncertainty from Beginning to End
Uncertainty-Aware CNNs for Depth Completion: Uncertainty from Beginning to End
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Uncertainty-Aware CNNs for Depth Completion: Uncertainty from Beginning to End

Eldesokey, Abdelrahman ; Felsberg, Michael ; Holmquist, Karl ; Persson, Mikael

2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2020, p.12011

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2
Multi-task Learning Using Uncertainty to Weigh Losses for Scene Geometry and Semantics
Multi-task Learning Using Uncertainty to Weigh Losses for Scene Geometry and Semantics
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Multi-task Learning Using Uncertainty to Weigh Losses for Scene Geometry and Semantics

Cipolla, Roberto ; Gal, Yarin ; Kendall, Alex

2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.7482-7491

IEEE

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3
The Power of Ensembles for Active Learning in Image Classification
The Power of Ensembles for Active Learning in Image Classification
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The Power of Ensembles for Active Learning in Image Classification

Beluch, William H. ; Genewein, Tim ; Nurnberger, Andreas ; Kohler, Jan M.

2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.9368-9377

IEEE

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4
CodeSLAM - Learning a Compact, Optimisable Representation for Dense Visual SLAM
CodeSLAM - Learning a Compact, Optimisable Representation for Dense Visual SLAM
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CodeSLAM - Learning a Compact, Optimisable Representation for Dense Visual SLAM

Bloesch, Michael ; Czarnowski, Jan ; Clark, Ronald ; Leutenegger, Stefan ; Davison, Andrew J.

2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.2560-2568

IEEE

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5
Robust visual inertial odometry using a direct EKF-based approach
Robust visual inertial odometry using a direct EKF-based approach
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Robust visual inertial odometry using a direct EKF-based approach

Bloesch, Michael ; Omari, Sammy ; Hutter, Marco ; Siegwart, Roland

2015 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS), 2015, p.298-304

IEEE

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6
Lightweight Probabilistic Deep Networks
Lightweight Probabilistic Deep Networks
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Lightweight Probabilistic Deep Networks

Gast, Jochen ; Roth, Stefan

2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.3369-3378

IEEE

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7
Unified temporal and spatial calibration for multi-sensor systems
Unified temporal and spatial calibration for multi-sensor systems
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Unified temporal and spatial calibration for multi-sensor systems

Furgale, Paul ; Rehder, Joern ; Siegwart, Roland

2013 IEEE/RSJ International Conference on Intelligent Robots and Systems, 2013, p.1280-1286

IEEE

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8
Quantization of Fully Convolutional Networks for Accurate Biomedical Image Segmentation
Quantization of Fully Convolutional Networks for Accurate Biomedical Image Segmentation
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Quantization of Fully Convolutional Networks for Accurate Biomedical Image Segmentation

Xu, Xiaowei ; Lu, Qing ; Yang, Lin ; Hu, Sharon ; Chen, Danny ; Hu, Yu ; Shi, Yiyu

2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.8300-8308

IEEE

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9
Augmenting Physical Simulators with Stochastic Neural Networks: Case Study of Planar Pushing and Bouncing
Augmenting Physical Simulators with Stochastic Neural Networks: Case Study of Planar Pushing and Bouncing
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Augmenting Physical Simulators with Stochastic Neural Networks: Case Study of Planar Pushing and Bouncing

Ajay, Anurag ; Wu, Jiajun ; Fazeli, Nima ; Bauza, Maria ; Kaelbling, Leslie P. ; Tenenbaum, Joshua B. ; Rodriguez, Alberto

2018 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS), 2018, p.3066-3073

IEEE

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10
Optimal measurement locations based on uncertainty intervals for state identification in distribution grids
Optimal measurement locations based on uncertainty intervals for state identification in distribution grids
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Optimal measurement locations based on uncertainty intervals for state identification in distribution grids

Schmidt, Maximilian ; Hess, Tobias ; Schegner, Peter

2017 IEEE Power & Energy Society General Meeting, 2017, p.1-5

IEEE

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