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Refinado por: Base de dados/Biblioteca: IEEE Electronic Library (IEL) Journals remover tipo de recurso: magazinearticle remover
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Nonlinear System Identification: A User-Oriented Road Map
Nonlinear System Identification: A User-Oriented Road Map
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Nonlinear System Identification: A User-Oriented Road Map

Schoukens, Johan ; Ljung, Lennart

IEEE control systems, 2019-12, Vol.39 (6), p.28-99 [Periódico revisado por pares]

IEEE

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2
Correction to "Scalable Network Synchronization with Pulse-Coupled Oscillators"
Correction to "Scalable Network Synchronization with Pulse-Coupled Oscillators"
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Correction to "Scalable Network Synchronization with Pulse-Coupled Oscillators"

Pagliari, Roberto ; Scaglione, Anna

IEEE transactions on mobile computing, 2011-05, Vol.10 (5), p.749-749 [Periódico revisado por pares]

Los Alamitos: IEEE

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3
Design of VT-Sensitive Ring Oscillators for Monitoring Gate-TDDB Environmental Stress
Design of VT-Sensitive Ring Oscillators for Monitoring Gate-TDDB Environmental Stress
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Design of VT-Sensitive Ring Oscillators for Monitoring Gate-TDDB Environmental Stress

Takeuchi, Kan ; Shimada, Masaki ; Okagaki, Takeshi ; Shibutani, Koji

IEEE transactions on device and materials reliability, 2019-03, Vol.19 (1), p.97-103 [Periódico revisado por pares]

New York: IEEE

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4
Hybrid Multi-Graphene/Si Avalanche Transit Time Terahertz Power Oscillator: Theoretical Reliability and Experimental Feasibility Studies
Hybrid Multi-Graphene/Si Avalanche Transit Time Terahertz Power Oscillator: Theoretical Reliability and Experimental Feasibility Studies
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Hybrid Multi-Graphene/Si Avalanche Transit Time Terahertz Power Oscillator: Theoretical Reliability and Experimental Feasibility Studies

Chakraborty, Debraj ; Chatterjee, Sulagna ; Mukherjee, Moumita

IEEE transactions on device and materials reliability, 2020-12, Vol.20 (4), p.667-677 [Periódico revisado por pares]

New York: IEEE

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5
The evolution of time measurement, Part 2: quartz clocks [Recalibration]
The evolution of time measurement, Part 2: quartz clocks [Recalibration]
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The evolution of time measurement, Part 2: quartz clocks [Recalibration]

Lombardi, M. A.

IEEE instrumentation & measurement magazine, 2011-10, Vol.14 (5), p.41-48

New York: IEEE

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6
Impact of Interfacial Fixed Charges on the Electrical Characteristics of Pocket-Doped Double-Gate Tunnel FET
Impact of Interfacial Fixed Charges on the Electrical Characteristics of Pocket-Doped Double-Gate Tunnel FET
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Impact of Interfacial Fixed Charges on the Electrical Characteristics of Pocket-Doped Double-Gate Tunnel FET

Mishra, Abhishek ; Narang, Rakhi ; Saxena, Manoj ; Gupta, Mridula

IEEE transactions on device and materials reliability, 2016-06, Vol.16 (2), p.117-122 [Periódico revisado por pares]

New York: IEEE

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7
Monitor-Based In-Field Wearout Mitigation for CMOS LC Oscillators
Monitor-Based In-Field Wearout Mitigation for CMOS LC Oscillators
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Monitor-Based In-Field Wearout Mitigation for CMOS LC Oscillators

Doohwang Chang ; Kitchen, Jennifer N. ; Bakkaloglu, Bertan ; Kiaei, Sayfe ; Ozev, Sule

IEEE transactions on device and materials reliability, 2016-06, Vol.16 (2), p.183-193 [Periódico revisado por pares]

New York: IEEE

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8
HandKey: Knocking-triggered Robust Vibration Signature for Keyless Unlocking
HandKey: Knocking-triggered Robust Vibration Signature for Keyless Unlocking
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HandKey: Knocking-triggered Robust Vibration Signature for Keyless Unlocking

Cao, Hangcheng ; Liu, Daibo ; Jiang, Hongbo ; Cai, Chao ; Zheng, Tianyue ; Lui, John C. S. ; Luo, Jun

IEEE transactions on mobile computing, 2024-01, Vol.23 (1), p.1-15 [Periódico revisado por pares]

IEEE

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9
A Design of a 15-GHz, Voltage-Controlled Ring Oscillator in 130-nm CMOS Technology: Optimizing Central Frequency and Power Dissipation
A Design of a 15-GHz, Voltage-Controlled Ring Oscillator in 130-nm CMOS Technology: Optimizing Central Frequency and Power Dissipation
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A Design of a 15-GHz, Voltage-Controlled Ring Oscillator in 130-nm CMOS Technology: Optimizing Central Frequency and Power Dissipation

taghizadeh, fatemeh ; Abouei, jamshid ; Ghafoorzadeh-Yazdi, Ali

IEEE industrial electronics magazine, 2021-03, Vol.15 (1), p.58-66

New York: IEEE

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10
Dynamic Modeling, Stability, and Control of Power Systems With Distributed Energy Resources: Handling Faults Using Two Control Methods in Tandem
Dynamic Modeling, Stability, and Control of Power Systems With Distributed Energy Resources: Handling Faults Using Two Control Methods in Tandem
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Dynamic Modeling, Stability, and Control of Power Systems With Distributed Energy Resources: Handling Faults Using Two Control Methods in Tandem

Sadamoto, Tomonori ; Chakrabortty, Aranya ; Ishizaki, Takayuki ; Imura, Jun-ichi

IEEE control systems, 2019-04, Vol.39 (2), p.34-65 [Periódico revisado por pares]

New York: IEEE

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