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Physics, Applied
| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Artigo
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Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputteringCarbone, D ; Alija, A ; Plantevin, O ; Gago, R ; Facsko, S ; Metzger, T HNanotechnology, 2008-01, Vol.19 (3), p.035304-035304 (5) [Periódico revisado por pares]England: IOP PublishingTexto completo disponível |
| 2 |
Material Type: Artigo
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Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipmentSalditt, T ; Metzger, T H ; Peisl, J ; Goerigk, GJournal of physics. D, Applied physics, 1995-04, Vol.28 (4A), p.A236-A240 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
| 3 |
Material Type: Artigo
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Structural and magnetic properties of an InGaAs/Fe3Si superlattice in cylindrical geometryDeneke, Ch ; Schumann, J ; Engelhard, R ; Thomas, J ; Müller, C ; Khatri, M S ; Malachias, A ; Weisser, M ; Metzger, T H ; Schmidt, O GNanotechnology, 2009-01, Vol.20 (4), p.045703-045703 (5) [Periódico revisado por pares]England: IOP PublishingTexto completo disponível |
| 4 |
Material Type: Artigo
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X-ray studies on self-organized wires in SiGe/Si multilayersRoch, T ; Holý, V ; Daniel, A ; Höflinger, E ; Meduna, M ; Metzger, T H ; Bauer, G ; Zhu, J ; Brunner, K ; Abstreiter, GJournal of physics. D, Applied physics, 2001-05, Vol.34 (10A), p.A6-A10 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
| 5 |
Material Type: Artigo
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Grazing incidence x-ray scattering: an ideal tool to study the structure of quantum dotsMetzger, T H ; Kegel, I ; Paniago, R ; Peisl, JJournal of physics. D, Applied physics, 1999-05, Vol.32 (10A), p.A202-A207 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
| 6 |
Material Type: Artigo
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X-ray pushing of a mechanical microswingSiria, A ; Rodrigues, M S ; Dhez, O ; Schwartz, W ; Torricelli, G ; LeDenmat, S ; Rochat, N ; Auvert, G ; Bikondoa, O ; Metzger, T H ; Wermeille, D ; Felici, R ; Comin, F ; Chevrier, JNanotechnology, 2008-11, Vol.19 (44), p.445501-445501 (5) [Periódico revisado por pares]England: IOP PublishingTexto completo disponível |
| 7 |
Material Type: Artigo
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Interface morphology in strained layer epitaxy of Si/Si1-xGex layers studied by x-ray scattering under grazing incidence and atomic force microscopyKOVATS, Z ; SALDITT, T ; METZGER, T. H ; PEISL, J ; STIMPEL, T ; LORENZ, H ; CHU, J. O ; ISMALL, KJournal of physics. D, Applied physics, 1999-02, Vol.32 (4), p.359-368 [Periódico revisado por pares]Bristol: Institute of PhysicsTexto completo disponível |
| 8 |
Material Type: Artigo
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Huang diffuse X-ray scattering from lattice strains in high-concentration Ta-H alloysMetzger, H ; Peisl, HJournal of physics. F, Metal physics, , Vol.8 (3), p.391-402IOP PublishingTexto completo disponível |
| 9 |
Material Type: Artigo
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Huang diffuse scattering of X-rays from the displacement field of hydrogen in niobiumMetzger, H ; Peisl, J ; Wanagel, JJournal of physics. F, Metal physics, , Vol.6 (12), p.2195-2206IOP PublishingTexto completo disponível |
| 10 |
Material Type: Artigo
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The trapping of hydrogen at nitrogen in niobium investigated by diffuse X-ray scatteringMetzger, T H ; Schubert, U ; Peisl, JJournal of physics. F, Metal physics, 1985-04, Vol.15 (4), p.779-797London: IOP PublishingTexto completo disponível |
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