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Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipment
Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipment
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Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipment

Salditt, T ; Metzger, T H ; Peisl, J ; Goerigk, G

Journal of physics. D, Applied physics, 1995-04, Vol.28 (4A), p.A236-A240 [Periódico revisado por pares]

Bristol: IOP Publishing

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2
X-ray studies on self-organized wires in SiGe/Si multilayers
X-ray studies on self-organized wires in SiGe/Si multilayers
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X-ray studies on self-organized wires in SiGe/Si multilayers

Roch, T ; Holý, V ; Daniel, A ; Höflinger, E ; Meduna, M ; Metzger, T H ; Bauer, G ; Zhu, J ; Brunner, K ; Abstreiter, G

Journal of physics. D, Applied physics, 2001-05, Vol.34 (10A), p.A6-A10 [Periódico revisado por pares]

Bristol: IOP Publishing

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3
Grazing incidence x-ray scattering: an ideal tool to study the structure of quantum dots
Grazing incidence x-ray scattering: an ideal tool to study the structure of quantum dots
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Grazing incidence x-ray scattering: an ideal tool to study the structure of quantum dots

Metzger, T H ; Kegel, I ; Paniago, R ; Peisl, J

Journal of physics. D, Applied physics, 1999-05, Vol.32 (10A), p.A202-A207 [Periódico revisado por pares]

IOP Publishing

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4
Interface morphology in strained layer epitaxy of Si/Si1-xGex layers studied by x-ray scattering under grazing incidence and atomic force microscopy
Interface morphology in strained layer epitaxy of Si/Si1-xGex layers studied by x-ray scattering under grazing incidence and atomic force microscopy
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Interface morphology in strained layer epitaxy of Si/Si1-xGex layers studied by x-ray scattering under grazing incidence and atomic force microscopy

KOVATS, Z ; SALDITT, T ; METZGER, T. H ; PEISL, J ; STIMPEL, T ; LORENZ, H ; CHU, J. O ; ISMALL, K

Journal of physics. D, Applied physics, 1999-02, Vol.32 (4), p.359-368 [Periódico revisado por pares]

Bristol: Institute of Physics

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5
Experimental and theoretical comparison of Sb, As, and P diffusion mechanisms and doping in CdTe
Experimental and theoretical comparison of Sb, As, and P diffusion mechanisms and doping in CdTe
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Experimental and theoretical comparison of Sb, As, and P diffusion mechanisms and doping in CdTe

Colegrove, E ; Yang, J-H ; Harvey, S P ; Young, M R ; Burst, J M ; Duenow, J N ; Albin, D S ; Wei, S-H ; Metzger, W K

Journal of physics. D, Applied physics, 2018-01, Vol.51 (7), p.75102 [Periódico revisado por pares]

United States: IOP Publishing

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