skip to main content
Idioma:
Resultados 1 2 3 4 5 next page
Mostrar Somente
Refinado por: assunto: Physics, Applied remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography
Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography
Material Type:
Artigo 		Adicionar ao Meu Espaço

Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography

Rastelli, Armando ; Stoffel, Mathieu ; Malachias, Angelo ; Merdzhanova, Tsvetelina ; Katsaros, Georgios ; Kern, Klaus ; Metzger, Till H ; Schmidt, Oliver G

Nano letters, 2008-05, Vol.8 (5), p.1404-1409 [Periódico revisado por pares]

Washington, DC: American Chemical Society

Texto completo disponível

Citações Citado por
2
Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry
Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry
Material Type:
Artigo 		Adicionar ao Meu Espaço

Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry

Diaz, Ana ; Mocuta, Cristian ; Stangl, Julian ; Keplinger, Mario ; Weitkamp, Timm ; Pfeiffer, Franz ; David, Christian ; Metzger, Till H. ; Bauer, Günther

Journal of synchrotron radiation, 2010-05, Vol.17 (3), p.299-307 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

Texto completo disponível

Citações Citado por
3
Three-dimensional diffraction mapping by tuning the X-ray energy
Three-dimensional diffraction mapping by tuning the X-ray energy
Material Type:
Artigo 		Adicionar ao Meu Espaço

Three-dimensional diffraction mapping by tuning the X-ray energy

Cornelius, T. W. ; Carbone, D. ; Jacques, V. L. R. ; Schülli, T. U. ; Metzger, T. H.

Journal of synchrotron radiation, 2011-05, Vol.18 (3), p.413-417 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

Texto completo disponível

Citações Citado por
4
Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering
Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering
Material Type:
Artigo 		Adicionar ao Meu Espaço

Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering

Carbone, D ; Alija, A ; Plantevin, O ; Gago, R ; Facsko, S ; Metzger, T H

Nanotechnology, 2008-01, Vol.19 (3), p.035304-035304 (5) [Periódico revisado por pares]

England: IOP Publishing

Texto completo disponível

Citações Citado por
5
In situ three-dimensional reciprocal-space mapping during mechanical deformation
In situ three-dimensional reciprocal-space mapping during mechanical deformation
Material Type:
Artigo 		Adicionar ao Meu Espaço

In situ three-dimensional reciprocal-space mapping during mechanical deformation

Cornelius, T. W. ; Davydok, A. ; Jacques, V. L. R. ; Grifone, R. ; Schülli, T. ; Richard, M.-I. ; Beutier, G. ; Verdier, M. ; Metzger, T. H. ; Pietsch, U. ; Thomas, O.

Journal of synchrotron radiation, 2012-09, Vol.19 (5), p.688-694 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

Texto completo disponível

Citações Citado por
6
Study of the effect of dielectric porosity on the stress in advanced Cu/low- k interconnects using x-ray diffraction
Study of the effect of dielectric porosity on the stress in advanced Cu/low- k interconnects using x-ray diffraction
Material Type:
Artigo 		Adicionar ao Meu Espaço

Study of the effect of dielectric porosity on the stress in advanced Cu/low- k interconnects using x-ray diffraction

Wilson, C J ; Zhao, C ; Zhao, L ; Metzger, T H ; Tőkei, Zs ; Croes, K ; Pantouvaki, M ; Beyer, G P ; Horsfall, A B ; O'Neill, A G

Applied physics letters, 2009-05, Vol.94 (18), p.181914-181914-3 [Periódico revisado por pares]

American Institute of Physics

Texto completo disponível

Citações Citado por
7
Shape, strain, and ordering of lateral InAs quantum dot molecules
Shape, strain, and ordering of lateral InAs quantum dot molecules
Material Type:
Artigo 		Adicionar ao Meu Espaço

Shape, strain, and ordering of lateral InAs quantum dot molecules

KRAUSE, B ; METZGER, T. H ; RASTELLI, A ; SONGMUANG, R ; KIRAVITTAYA, S ; SCHMIDT, O. G

Physical review. B, Condensed matter and materials physics, 2005-08, Vol.72 (8), p.085339.1-085339.12, Article 085339 [Periódico revisado por pares]

Ridge, NY: American Physical Society

Texto completo disponível

Citações Citado por
8
Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray microdiffraction
Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray microdiffraction
Material Type:
Artigo 		Adicionar ao Meu Espaço

Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray microdiffraction

Malachias, A. ; Deneke, Ch ; Krause, B. ; Mocuta, C. ; Kiravittaya, S. ; Metzger, T. H. ; Schmidt, O. G.

Physical review. B, Condensed matter and materials physics, 2009-01, Vol.79 (3), Article 035301 [Periódico revisado por pares]

Texto completo disponível

Citações Citado por
9
Strain distribution in nitride quantum dot multilayers
Strain distribution in nitride quantum dot multilayers
Material Type:
Artigo 		Adicionar ao Meu Espaço

Strain distribution in nitride quantum dot multilayers

Chamard, V. ; Schülli, T ; Sztucki, M. ; Metzger, T. H. ; Sarigiannidou, E. ; Rouvière, J.-L. ; Tolan, M. ; Adelmann, C. ; Daudin, B.

Physical review. B, Condensed matter and materials physics, 2004-03, Vol.69 (12), Article 125327 [Periódico revisado por pares]

American Physical Society

Texto completo disponível

Citações Citado por
10
X-ray study of atomic ordering in self-assembled Ge islands grown on Si(001)
X-ray study of atomic ordering in self-assembled Ge islands grown on Si(001)
Material Type:
Artigo 		Adicionar ao Meu Espaço

X-ray study of atomic ordering in self-assembled Ge islands grown on Si(001)

MALACHIAS, A ; SCHÜLLI, T. U ; MEDEIROS-RIBEIRO, G ; CANCADO, L. G ; STOFFEL, M ; SCHMIDT, O. G ; METZGER, T. H ; MAGALHAES-PANIAGO, R

Physical review. B, Condensed matter and materials physics, 2005-10, Vol.72 (16), p.165315.1-165315.9, Article 165315 [Periódico revisado por pares]

Ridge, NY: American Physical Society

Texto completo disponível

Citações Citado por
Resultados 1 2 3 4 5 next page

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

Mostrar Somente

  1. Revistas revisadas por pares (150)

Refinar Meus Resultados

Tipo de Recurso 

  1. Artigos  (176)
  2. Anais de Congresso  (14)
  3. Mais opções open sub menu

Data de Publicação 

De até
Refinar
  1. Antes de1988  (13)
  2. 1988Até1996  (31)
  3. 1997Até2004  (58)
  4. 2005Até2013  (65)
  5. Após 2013  (28)
  6. Mais opções open sub menu

Idioma 

  1. Japonês  (46)
  2. Alemão  (1)
  3. Mais opções open sub menu

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.