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Refinado por: Base de dados/Biblioteca: Elsevier ScienceDirect Journals remover Nome da Publicação: Nuclear Instruments & Methods In Physics Research. Section B, Beam Interactions With Materials And Atoms remover
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External-RBS, PIXE and NRA analysis for ancient swords
External-RBS, PIXE and NRA analysis for ancient swords
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External-RBS, PIXE and NRA analysis for ancient swords

Santos, Hellen C. ; Added, Nemitala ; Silva, Tiago F. ; Rodrigues, C.L.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2015-02, Vol.345, p.42-47 [Periódico revisado por pares]

Elsevier B.V

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External-PIXE analysis for the study of pigments from a painting from the Museum of Contemporary Art
External-PIXE analysis for the study of pigments from a painting from the Museum of Contemporary Art
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External-PIXE analysis for the study of pigments from a painting from the Museum of Contemporary Art

Rizzutto, M.A. ; Moro, M.V. ; Silva, T.F. ; Trindade, G.F. ; Added, N. ; Tabacniks, M.H. ; Kajiya, E.M. ; Campos, P.H.V. ; Magalhães, A.G. ; Barbosa, M.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2014-08, Vol.332, p.411-414 [Periódico revisado por pares]

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3
Computer simulation of backscattering spectra from paint
Computer simulation of backscattering spectra from paint
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Computer simulation of backscattering spectra from paint

Mayer, M. ; Silva, T.F.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2017-09, Vol.406, p.75-81 [Periódico revisado por pares]

Elsevier B.V

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4
Bias and synergy in the self-consistent approach of data analysis of ion beam techniques
Bias and synergy in the self-consistent approach of data analysis of ion beam techniques
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Bias and synergy in the self-consistent approach of data analysis of ion beam techniques

Silva, T.F. ; Rodrigues, C.L. ; Tabacniks, M.H. ; von Toussaint, U. ; Mayer, M.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2022-12, Vol.533, p.9-16 [Periódico revisado por pares]

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5
Ion microprobe study of the scale formed during high temperature oxidation of high silicon EN-1.4301 stainless steel
Ion microprobe study of the scale formed during high temperature oxidation of high silicon EN-1.4301 stainless steel
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Ion microprobe study of the scale formed during high temperature oxidation of high silicon EN-1.4301 stainless steel

Paúl, A. ; Elmrabet, S. ; Alves, L.C. ; da Silva, M.F. ; Soares, J.C. ; Odriozola, J.A.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2001-07, Vol.181 (1), p.394-398 [Periódico revisado por pares]

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6
Self-consistent ion beam analysis: An approach by multi-objective optimization
Self-consistent ion beam analysis: An approach by multi-objective optimization
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Self-consistent ion beam analysis: An approach by multi-objective optimization

Silva, T.F. ; Rodrigues, C.L. ; Added, N. ; Rizzutto, M.A. ; Tabacniks, M.H. ; Höschen, T. ; von Toussaint, U. ; Mayer, M.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2021-11, Vol.506, p.32-40 [Periódico revisado por pares]

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7
Processing of massive Rutherford Back-scattering Spectrometry data by artificial neural networks
Processing of massive Rutherford Back-scattering Spectrometry data by artificial neural networks
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Processing of massive Rutherford Back-scattering Spectrometry data by artificial neural networks

Guimarães, Renato da S. ; Silva, Tiago F. ; Rodrigues, Cleber L. ; Tabacniks, Manfredo H. ; Bach, Simon ; Burwitz, Vassily V. ; Hiret, Paul ; Mayer, Matej

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2021-04, Vol.493, p.28-34 [Periódico revisado por pares]

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8
Ion beam and photoluminescence studies of Er and O implanted GaN
Ion beam and photoluminescence studies of Er and O implanted GaN
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Ion beam and photoluminescence studies of Er and O implanted GaN

Alves, E. ; da Silva, M.F. ; Soares, J.C. ; Vianden, R. ; Bartels, J. ; Kozanecki, A.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1999, Vol.147 (1), p.383-387 [Periódico revisado por pares]

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9
Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications
Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications
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Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications

Silva, T.F. ; Rodrigues, C.L. ; Added, N. ; Rizzutto, M.A. ; Tabacniks, M.H. ; Mangiarotti, A. ; Curado, J.F. ; Aguirre, F.R. ; Aguero, N.F. ; Allegro, P.R.P. ; Campos, P.H.O.V. ; Restrepo, J.M. ; Trindade, G.F. ; Antonio, M.R. ; Assis, R.F. ; Leite, A.R.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2018-05, Vol.422, p.68-77 [Periódico revisado por pares]

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10
Ion beam analysis and big data: How data science can support next-generation instrumentation
Ion beam analysis and big data: How data science can support next-generation instrumentation
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Ion beam analysis and big data: How data science can support next-generation instrumentation

Silva, Tiago F. ; Rodrigues, Cleber L. ; Tabacniks, Manfredo H. ; Pereira, Hugo D.C. ; Saramela, Thiago B. ; Guimarães, Renato O.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2020-09, Vol.478, p.111-115 [Periódico revisado por pares]

Elsevier B.V

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