Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Artigo
|
How to Identify a Bathtub Hazard RateAarset, Magne VollanIEEE transactions on reliability, 1987-04, Vol.R-36 (1), p.106-108 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
|
2 |
Material Type: Artigo
|
Reliability analysis techniques for complex multiple fault tolerant computer architecturesSomani, A.K. ; Sarnaik, T.R.IEEE transactions on reliability, 1990-12, Vol.39 (5), p.547-556 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
|
3 |
Material Type: Artigo
|
Sequential imperfect preventive maintenance policiesNakagawa, T.IEEE transactions on reliability, 1988-08, Vol.37 (3), p.295-298 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
|
4 |
Material Type: Artigo
|
Optimum simple step-stress accelerated life tests with censoringBai, D.S. ; Kim, M.S. ; Lee, S.H.IEEE transactions on reliability, 1989-12, Vol.38 (5), p.528-532 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
|
5 |
Material Type: Artigo
|
A census of Tandem system availability between 1985 and 1990Gray, J.IEEE transactions on reliability, 1990-10, Vol.39 (4), p.409-418 [Periódico revisado por pares]IEEETexto completo disponível |
|
6 |
Material Type: Artigo
|
Error log analysis: statistical modeling and heuristic trend analysisLin, T.-T.Y. ; Siewiorek, D.P.IEEE transactions on reliability, 1990-10, Vol.39 (4), p.419-432 [Periódico revisado por pares]IEEETexto completo disponível |
|
7 |
Material Type: Artigo
|
Reliability of scrubbing recovery-techniques for memory systemsSaleh, A.M. ; Serrano, J.J. ; Patel, J.H.IEEE transactions on reliability, 1990-04, Vol.39 (1), p.114-122 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
|
8 |
Material Type: Artigo
|
Fault tree analysis, methods, and applications. A reviewLEE, W. S ; GROSH, D. L ; TILLMAN, F. A ; LIE, C. HIEEE transactions on reliability, 1985-01, Vol.34 (3), p.194-203 [Periódico revisado por pares]New York, NY: Institute of Electrical and Electronics EngineersTexto completo disponível |
|
9 |
Material Type: Artigo
|
A consecutive-k-out-of-n:G system: the mirror image of a consecutive-k-out-of-n:F systemKuo, W. ; Zhang, W. ; Zuo, M.IEEE transactions on reliability, 1990-06, Vol.39 (2), p.244-253 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
|
10 |
Material Type: Artigo
|
Computational Complexity of Network Reliability Analysis: An OverviewBall, Michael O.IEEE transactions on reliability, 1986, Vol.35 (3), p.230-239 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |