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11
Nanoscale structures and dynamics of a boundary liquid layer
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Nanoscale structures and dynamics of a boundary liquid layer

WALZ, M ; GERTH, S ; FALUS, P ; KLIMCZAK, M ; METZGER, T. H ; MAGERL, A

Journal of physics. Condensed matter, 2011-08, Vol.23 (32), p.324102-9 [Periódico revisado por pares]

Bristol: Institute of Physics

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12
Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering
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Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputtering

Carbone, D ; Alija, A ; Plantevin, O ; Gago, R ; Facsko, S ; Metzger, T H

Nanotechnology, 2008-01, Vol.19 (3), p.035304-035304 (5) [Periódico revisado por pares]

England: IOP Publishing

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13
X-ray Structure Analysis of Free-Standing Lipid Membranes Facilitated by Micromachined Apertures
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X-ray Structure Analysis of Free-Standing Lipid Membranes Facilitated by Micromachined Apertures

Beerlink, André ; Wilbrandt, P.-J ; Ziegler, E ; Carbone, D ; Metzger, T. H ; Salditt, Tim

Langmuir, 2008-05, Vol.24 (9), p.4952-4958 [Periódico revisado por pares]

Washington, DC: American Chemical Society

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14
In situ three-dimensional reciprocal-space mapping during mechanical deformation
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In situ three-dimensional reciprocal-space mapping during mechanical deformation

Cornelius, T. W. ; Davydok, A. ; Jacques, V. L. R. ; Grifone, R. ; Schülli, T. ; Richard, M.-I. ; Beutier, G. ; Verdier, M. ; Metzger, T. H. ; Pietsch, U. ; Thomas, O.

Journal of synchrotron radiation, 2012-09, Vol.19 (5), p.688-694 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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15
Multiple scattering effects in strain and composition analysis of nanoislands by grazing incidence x rays
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Multiple scattering effects in strain and composition analysis of nanoislands by grazing incidence x rays

Richard, M.-I. ; Favre-Nicolin, V. ; Renaud, G. ; Schülli, T. U. ; Priester, C. ; Zhong, Z. ; Metzger, T.-H.

Applied physics letters, 2009-01, Vol.94 (1), p.013112-1-3 [Periódico revisado por pares]

American Institute of Physics

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16
Pure silica BETA colloidal zeolite assembled in thin films
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Pure silica BETA colloidal zeolite assembled in thin films

Mintova, S ; Reinelt, M ; Metzger, T H ; Senker, J ; Bein, T

Chemical communications (Cambridge, England), 2003-02 (3), p.326-327 [Periódico revisado por pares]

England

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17
Local structure of a rolled-up single crystal: an X-ray microdiffraction study of individual semiconductor nanotubes
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Local structure of a rolled-up single crystal: an X-ray microdiffraction study of individual semiconductor nanotubes

Krause, B ; Mocuta, C ; Metzger, T H ; Deneke, Ch ; Schmidt, O G

Physical review letters, 2006-04, Vol.96 (16), p.165502-165502, Article 165502 [Periódico revisado por pares]

United States

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18
Nanostructure of Biogenic Calcite and Its Modification under Annealing: Study by High-Resolution X‑ray Diffraction and Nanoindentation
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Nanostructure of Biogenic Calcite and Its Modification under Annealing: Study by High-Resolution X‑ray Diffraction and Nanoindentation

Metzger, Till H ; Politi, Yael ; Carbone, Gerardina ; Bayerlein, Bernd ; Zlotnikov, Igor ; Zolotoyabko, Emil ; Fratzl, Peter

Crystal growth & design, 2014-10, Vol.14 (10), p.5275-5282 [Periódico revisado por pares]

Washington,DC: American Chemical Society

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19
Shape, strain, and ordering of lateral InAs quantum dot molecules
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Shape, strain, and ordering of lateral InAs quantum dot molecules

KRAUSE, B ; METZGER, T. H ; RASTELLI, A ; SONGMUANG, R ; KIRAVITTAYA, S ; SCHMIDT, O. G

Physical review. B, Condensed matter and materials physics, 2005-08, Vol.72 (8), p.085339.1-085339.12, Article 085339 [Periódico revisado por pares]

Ridge, NY: American Physical Society

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20
Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray microdiffraction
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Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray microdiffraction

Malachias, A. ; Deneke, Ch ; Krause, B. ; Mocuta, C. ; Kiravittaya, S. ; Metzger, T. H. ; Schmidt, O. G.

Physical review. B, Condensed matter and materials physics, 2009-01, Vol.79 (3), Article 035301 [Periódico revisado por pares]

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