Ionizing radiation hardness tests of GaN HEMTs for harsh environments
Alexis C. Vilas Bôas M.A.A. de Melo; R. B. B Santos; R Giacomini; Nilberto H Medina; L. E Seixas; S Finco; F. R Palomo; A Romero-Maestre; Marcilei A Guazzelli
Microelectronics Reliability Amsterdam: Elsevier, 2021 v. 116, janeiro de 2021, número do artigo: 114000
Amsterdam 2021
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Radiation Hardness of GaN HEMTs to TID Effects: COTS for harsh environments
Alexis C Vilas Bôas M A A de Melo; R B B Santos; R Giacomini; Nilberto Heder Medina; L E Seixas; S Finco; F R Palomo; A Romero-Maestre; Marcilei A Guazzelli; European Conference on Radiation and its Effects on Components and Systems (RADECS) (19th 2019 MONTPELLIER, FRANCE)
New York IEEE 2022
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Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA
Fabio Benevenuti Ádria Oliveira; Israel da Costa Lopes; Fernanda Kastensmidt; Nilberto Heder Medina; Nemitala Added; Vitor Ângelo Paulino de Aguiar; Marcilei Aparecida Guazzelli; European Conference on Radiation and its Effects on Components and Systems (RADECS) (19th 2019 MONTPELLIER, FRANCE)
New York IEEE 2022
Item não circula. Consulte sua biblioteca.(Acessar)