Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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Tough challenges as design and test go nanometerKapur, R. ; Williams, T.W.Computer (Long Beach, Calif.), 1999-11, Vol.32 (11), p.42-45 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Can we make operating systems reliable and secure?Tanenbaum, A.S. ; Herder, J.N. ; Bos, H.Computer (Long Beach, Calif.), 2006-05, Vol.39 (5), p.44-51 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |