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Acceleration of trace-based fault simulation of combinational circuits
Acceleration of trace-based fault simulation of combinational circuits
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Acceleration of trace-based fault simulation of combinational circuits

Song, O.Y. ; Menon, P.R.

IEEE transactions on computer-aided design of integrated circuits and systems, 1993-09, Vol.12 (9), p.1413-1419 [Periódico revisado por pares]

New York, NY: IEEE

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12
Accurate Direct and Indirect On-Chip Temperature Sensing for Efficient Dynamic Thermal Management
Accurate Direct and Indirect On-Chip Temperature Sensing for Efficient Dynamic Thermal Management
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Accurate Direct and Indirect On-Chip Temperature Sensing for Efficient Dynamic Thermal Management

Sharifi, S ; Rosing, T S

IEEE transactions on computer-aided design of integrated circuits and systems, 2010-10, Vol.29 (10), p.1586-1599 [Periódico revisado por pares]

New York: IEEE

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13
Accurate Modeling of the Delay and Energy Overhead of Dynamic Voltage and Frequency Scaling in Modern Microprocessors
Accurate Modeling of the Delay and Energy Overhead of Dynamic Voltage and Frequency Scaling in Modern Microprocessors
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Accurate Modeling of the Delay and Energy Overhead of Dynamic Voltage and Frequency Scaling in Modern Microprocessors

Sangyoung Park ; Jaehyun Park ; Donghwa Shin ; Yanzhi Wang ; Qing Xie ; Pedram, M. ; Naehyuck Chang

IEEE transactions on computer-aided design of integrated circuits and systems, 2013-05, Vol.32 (5), p.695-708 [Periódico revisado por pares]

IEEE

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14
Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling
Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling
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Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling

Ahmed, Foisal ; Shintani, Michihiro ; Inoue, Michiko

IEEE transactions on computer-aided design of integrated circuits and systems, 2021-08, Vol.40 (8), p.1626-1639 [Periódico revisado por pares]

IEEE

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15
Achievable-Rate-Aware Retention-Error Correction for Multi-Level-Cell NAND Flash Memory
Achievable-Rate-Aware Retention-Error Correction for Multi-Level-Cell NAND Flash Memory
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Achievable-Rate-Aware Retention-Error Correction for Multi-Level-Cell NAND Flash Memory

Bu, Yingcheng ; Fang, Yi ; Zhang, Guohua ; Cheng, Jun

IEEE transactions on computer-aided design of integrated circuits and systems, 2022-10, Vol.41 (10), p.3438-3451 [Periódico revisado por pares]

New York: IEEE

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16
ADAMIN: automated, accurate macromodeling of digital aggressors for power and ground supply noise prediction
ADAMIN: automated, accurate macromodeling of digital aggressors for power and ground supply noise prediction
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ADAMIN: automated, accurate macromodeling of digital aggressors for power and ground supply noise prediction

Zhe Wang ; Murgai, R. ; Roychowdhury, J.

IEEE transactions on computer-aided design of integrated circuits and systems, 2005-01, Vol.24 (1), p.56-64 [Periódico revisado por pares]

IEEE

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17
Adaptive Regression-Based Thermal Modeling and Optimization for Monolithic 3-D ICs
Adaptive Regression-Based Thermal Modeling and Optimization for Monolithic 3-D ICs
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Adaptive Regression-Based Thermal Modeling and Optimization for Monolithic 3-D ICs

Samal, Sandeep Kumar ; Panth, Shreepad ; Samadi, Kambiz ; Saeidi, Mehdi ; Yang Du ; Sung Kyu Lim

IEEE transactions on computer-aided design of integrated circuits and systems, 2016-10, Vol.35 (10), p.1707-1720 [Periódico revisado por pares]

New York: IEEE

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18
Adaptive Scratch Pad Memory Management for Dynamic Behavior of Multimedia Applications
Adaptive Scratch Pad Memory Management for Dynamic Behavior of Multimedia Applications
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Adaptive Scratch Pad Memory Management for Dynamic Behavior of Multimedia Applications

Doosan Cho ; Pasricha, S. ; Issenin, I. ; Dutt, N.D. ; Minwook Ahn ; Yunheung Paek

IEEE transactions on computer-aided design of integrated circuits and systems, 2009-04, Vol.28 (4), p.554-567 [Periódico revisado por pares]

New York: IEEE

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19
Adaptive Switch on Wear Leveling for Enhancing I/O Latency and Lifetime of High-density SSDs
Adaptive Switch on Wear Leveling for Enhancing I/O Latency and Lifetime of High-density SSDs
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Adaptive Switch on Wear Leveling for Enhancing I/O Latency and Lifetime of High-density SSDs

Wu, Jiaojiao ; Li, Jun ; Sha, Zhibing ; Cai, Zhigang ; Liao, Jianwei

IEEE transactions on computer-aided design of integrated circuits and systems, 2022-11, Vol.41 (11), p.1-1 [Periódico revisado por pares]

New York: IEEE

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20
Advances in Computation of the Maximum of a Set of Gaussian Random Variables
Advances in Computation of the Maximum of a Set of Gaussian Random Variables
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Advances in Computation of the Maximum of a Set of Gaussian Random Variables

Sinha, D. ; Hai Zhou ; Shenoy, N.V.

IEEE transactions on computer-aided design of integrated circuits and systems, 2007-08, Vol.26 (8), p.1522-1533 [Periódico revisado por pares]

New York: IEEE

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