Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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A robust visual tracking system for patient motion detection in SPECT: hardware solutionsBruyant, P.P. ; Gennert, M.A. ; Speckert, G.C. ; Beach, R.D. ; Morgenstern, J.D. ; Kumar, N. ; Nadella, S. ; King, M.A.IEEE transactions on nuclear science, 2005-10, Vol.52 (5), p.1288-1294 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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2 |
Material Type: Artigo
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Evaluation of a position sensitive avalanche photodiode for PETBurr, K.C. ; Ivan, A. ; LeBlanc, J. ; Zelakiewicz, S. ; McDaniel, D.L. ; Kim, C.L. ; Ganin, A. ; Shah, K.S. ; Grazioso, R. ; Farrell, R. ; Glodo, J.IEEE transactions on nuclear science, 2003-08, Vol.50 (4), p.792-796 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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Algebraic PET image reconstruction with pre-computed reconstruction operators using subsets of sensitivity functionsYamaya, T. ; Obi, T. ; Yamaguchi, M. ; Kita, K. ; Ohyama, N. ; Murayama, H.IEEE transactions on nuclear science, 2000-08, Vol.47 (4), p.1670-1675 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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4 |
Material Type: Artigo
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High sensitivity, total body PET scanning using 3D data acquisition and reconstructionCherry, S.R. ; Dahlbom, M. ; Hoffman, E.J.IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1992-08, Vol.39 (4), p.1088-1092 [Periódico revisado por pares]NEW YORK: IEEETexto completo disponível |
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5 |
Material Type: Artigo
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A Maximum Likelihood Approach to Emission Image Reconstruction from ProjectionsRockmore, A. J. ; Macovski, AlbertIEEE transactions on nuclear science, 1976-01, Vol.23 (4), p.1428-1432 [Periódico revisado por pares]IEEETexto completo disponível |
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6 |
Material Type: Artigo
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Advances in CdTe Gamma-Ray DetectorsSerreze, H. B. ; Entine, G. ; Bell, R. O. ; Wald, F. V.IEEE transactions on nuclear science, 1974-01, Vol.21 (1), p.404-407 [Periódico revisado por pares]IEEETexto completo disponível |