skip to main content
Idioma:
Resultados 1 2 3 4 5 next page
Mostrar Somente
Refinado por: Base de dados/Biblioteca: Aerospace Database remover tipo de recurso: magazinearticle remover IEEE Electronic Library (IEL) Journals remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Interior Degradation Analysis of Distributed Feedback Laser Using Optical-Beam-Induced Current
Interior Degradation Analysis of Distributed Feedback Laser Using Optical-Beam-Induced Current
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Interior Degradation Analysis of Distributed Feedback Laser Using Optical-Beam-Induced Current

Takeshita, T. ; Oda, K. ; Mawatari, H.

IEEE transactions on device and materials reliability, 2014-12, Vol.14 (4), p.1074-1079 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
2
Quantitative Investigation of Laser Beam Modulation in Electrically Active Devices as Used in Laser Voltage Probing
Quantitative Investigation of Laser Beam Modulation in Electrically Active Devices as Used in Laser Voltage Probing
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Quantitative Investigation of Laser Beam Modulation in Electrically Active Devices as Used in Laser Voltage Probing

Kindereit, U. ; Woods, G. ; Jing Tian ; Kerst, U. ; Leihkauf, R. ; Boit, C.

IEEE transactions on device and materials reliability, 2007-03, Vol.7 (1), p.19-30 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
3
Space Radiation Effects and Reliability Considerations for Micro- and Optoelectronic Devices
Space Radiation Effects and Reliability Considerations for Micro- and Optoelectronic Devices
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Space Radiation Effects and Reliability Considerations for Micro- and Optoelectronic Devices

Johnston, A H

IEEE transactions on device and materials reliability, 2010-12, Vol.10 (4), p.449-459 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
4
Systematic Characterization of Integrated Circuit Standard Components as Stimulated by Scanning Laser Beam
Systematic Characterization of Integrated Circuit Standard Components as Stimulated by Scanning Laser Beam
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Systematic Characterization of Integrated Circuit Standard Components as Stimulated by Scanning Laser Beam

Glowacki, A.M. ; Brahma, S.K. ; Suzuki, H. ; Boit, C.

IEEE transactions on device and materials reliability, 2007-03, Vol.7 (1), p.31-49 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
5
The Impact of Mechanical Defects on the Reliability of Solar Cells in Aerospace Applications
The Impact of Mechanical Defects on the Reliability of Solar Cells in Aerospace Applications
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

The Impact of Mechanical Defects on the Reliability of Solar Cells in Aerospace Applications

Zimmermann, C.G.

IEEE transactions on device and materials reliability, 2006-09, Vol.6 (3), p.486-494 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
6
Addendum: Modular heat sinks for desktop computers and other electronics
Addendum: Modular heat sinks for desktop computers and other electronics
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Addendum: Modular heat sinks for desktop computers and other electronics

Klett, J.W. ; Trammell, M.

IEEE transactions on device and materials reliability, 2004-12, Vol.4 (4), p.638-640 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
7
Reliability-extrapolation methodology of semiconductor laser diodes: is a quick life test feasible?
Reliability-extrapolation methodology of semiconductor laser diodes: is a quick life test feasible?
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Reliability-extrapolation methodology of semiconductor laser diodes: is a quick life test feasible?

Huang, J.-S.

IEEE transactions on device and materials reliability, 2006-03, Vol.6 (1), p.46-51 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
8
Theoretical and experimental study on junction temperature of packaged Fabry-Perot laser diode
Theoretical and experimental study on junction temperature of packaged Fabry-Perot laser diode
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Theoretical and experimental study on junction temperature of packaged Fabry-Perot laser diode

Jae-Ho Han ; Park, S.W.

IEEE transactions on device and materials reliability, 2004-06, Vol.4 (2), p.292-294 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
9
Rapid diagnostics of ASIC circuit marginalities using dynamic laser stimulation
Rapid diagnostics of ASIC circuit marginalities using dynamic laser stimulation
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Rapid diagnostics of ASIC circuit marginalities using dynamic laser stimulation

Liao, J.Y. ; Woods, G.L. ; Marks, H.L.

IEEE transactions on device and materials reliability, 2006-03, Vol.6 (1), p.9-16 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
10
Scanning laser ultrasonics experiments for in situ nondestructive analysis of integrated circuits
Scanning laser ultrasonics experiments for in situ nondestructive analysis of integrated circuits
Material Type:
magazinearticle 		Adicionar ao Meu Espaço

Scanning laser ultrasonics experiments for in situ nondestructive analysis of integrated circuits

Andriamonje, G. ; Pouget, V. ; Ousten, Y. ; Lewis, D. ; Plano, B. ; Danto, Y.

IEEE transactions on device and materials reliability, 2005-09, Vol.5 (3), p.564-571 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
Resultados 1 2 3 4 5 next page

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

Mostrar Somente

  1. Revistas revisadas por pares (10)

Data de Publicação 

De até
Refinar
  1. Antes de1995  (6)
  2. 1995Até2000  (9)
  3. 2001Até2005  (21)
  4. 2006Até2015  (15)
  5. Após 2015  (11)
  6. Mais opções open sub menu

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.