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Refined by: author/creator: Aguiar, V remove Journal Title: IEEE Xplore remove
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Brazilian facilities to study radiation effects in electronic devices

Nilberto H. Medina Marcilei Aparecida Guazzelli; Nemitala Added; Vitor Ângelo Paulino de Aguiar; F Aguirre; R Giacomini; Eduardo Luiz Augusto Macchione; M. A. A Melo; J. A Oliveira; R. B. B Santos; L. E Seixas; Manfredo Tabacniks; European Conference on Radiation and its Effects on Components and Systems (RADECS) 23 a 27 de setembro de 2013 Oxford, Inglaterra

IEEE Xplore New York: IEEE, 2013 07p., Proc. RADECS 2013, Proceedings Paper

New York 2013

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Ionizing Radiation Effects on a COTS LowCost RISC Microcontroller

Felipe G H Leite Roberto B B Santos; Nilberto Heder Medina; Vitor Ângelo Paulino de Aguiar; Renato Camargo Giacomini; Nemitala Added; Fernando Aguirre; Eduardo Luiz Augusto Macchione; Fabian Vargas; Marcilei Aparecida Guazzelli da Silveira; IEEE Latin American Test Symposium (LATS) 2017 Bogota, Colombia) (18th

IEEE Xplore Conference publications New York v. 2017, p. 1-5, 2017

New York IEEE 2017

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by this author/creator:

  1. Macchione, E
  2. Aguirre, F
  3. Added, N
  4. Medina, N
  5. Giacomini, R

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