Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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4H-SiC normally-off vertical junction field-effect transistor with high current densityTone, K. ; Zhao, J.H. ; Fursin, L. ; Alexandrov, P. ; Weiner, M.IEEE electron device letters, 2003-07, Vol.24 (7), p.463-465 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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2 |
Material Type: Artigo
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1710-V 2.77-m/Omega/cm(2) 4H-SiC trenched and implanted vertical junction field-effect transistorsZhao, J H ; Tone, K ; Alexandrov, P ; Fursin, L ; Weiner, MIEEE electron device letters, 2003-02, Vol.24 (2), p.81-83 [Periódico revisado por pares]Texto completo disponível |
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3 |
Material Type: Artigo
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1710-V 2.77-m/spl Omega/cmsub 2 4H-SiC trenched and implanted vertical junction field-effect transistorsZhao, J.H. ; Tone, K. ; Alexandrov, P. ; Fursin, L. ; Weiner, M.IEEE electron device letters, 2003-02, Vol.24 (2), p.81-83 [Periódico revisado por pares]IEEETexto completo disponível |
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4 |
Material Type: Artigo
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1710-V 2.77-m[Omega]cm2 4H-SiC trenched and implanted vertical junction field-effect transistorsZhao, J.H ; Tone, K ; Alexandrov, P ; Fursin, L ; Weiner, MIEEE electron device letters, 2003-02, Vol.24 (2), p.81 [Periódico revisado por pares]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
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5 |
Material Type: Artigo
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1710-V 2.77-m/spl Omega/cm sub 2 4H-SiC trenched and implanted vertical junction field-effect transistorsZhao, J.H. ; Tone, K. ; Alexandrov, P. ; Fursin, L. ; Weiner, M.IEEE electron device letters, 2003-02, Vol.24 (2), p.81-83 [Periódico revisado por pares]Texto completo disponível |
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6 |
Material Type: Artigo
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1710-V 2.77-mohm-cm2 4H-SiC trenched and implanted vertical junction field-effect transistorsZhao, Jian H ; Tone, K ; Alexandrov, P ; Fursin, L ; Weiner, MIEEE electron device letters, 2003-02, Vol.24 (2), p.81-83 [Periódico revisado por pares]Texto completo disponível |
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7 |
Material Type: Artigo
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1710-V 2.77-m Omega cm super(2) 4H-SiC trenched and implanted vertical junction field-effect transistorsZhao, J H ; Tone, K ; Alexandrov, P ; Fursin, L ; Weiner, MIEEE electron device letters, 2003-01, Vol.24 (2) [Periódico revisado por pares]Texto completo disponível |