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Adsorption of copper on tungsten low index planes at various substrate temperatures: A field emission microscopy study
Adsorption of copper on tungsten low index planes at various substrate temperatures: A field emission microscopy study
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Adsorption of copper on tungsten low index planes at various substrate temperatures: A field emission microscopy study

Sidorski, Z. ; Szelwicki, T. ; Dworecki, Z.

Thin solid films, 1981-01, Vol.75 (1), p.87-104 [Periódico revisado por pares]

Elsevier B.V

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2
Adsorption of xenon atoms on metal surfaces
Adsorption of xenon atoms on metal surfaces
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Adsorption of xenon atoms on metal surfaces

Ishi, S. ; Viswanathan, B.

Thin solid films, 1991-06, Vol.201 (2), p.373-402 [Periódico revisado por pares]

Lausanne: Elsevier B.V

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3
Effect of substrate temperature on the relation between the work function and the coverage for silver layers adsorbed on tungsten
Effect of substrate temperature on the relation between the work function and the coverage for silver layers adsorbed on tungsten
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Effect of substrate temperature on the relation between the work function and the coverage for silver layers adsorbed on tungsten

Sidorski, Z. ; Szelwicki, T. ; Dworecki, Z.

Thin solid films, 1979-08, Vol.61 (2), p.203-215 [Periódico revisado por pares]

Elsevier B.V

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4
Field emission microscopy study of silver adsorption on tungsten single-crystal planes
Field emission microscopy study of silver adsorption on tungsten single-crystal planes
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Field emission microscopy study of silver adsorption on tungsten single-crystal planes

Conţescu, Cr ; Vass, M.I.

Thin solid films, 1982-11, Vol.97 (3), p.245-257 [Periódico revisado por pares]

Elsevier B.V

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5
Smooth and rough Proteus mirabilis lipopolysaccharides studied by total internal reflection ellipsometry
Smooth and rough Proteus mirabilis lipopolysaccharides studied by total internal reflection ellipsometry
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Smooth and rough Proteus mirabilis lipopolysaccharides studied by total internal reflection ellipsometry

Gleńska-Olender, J. ; Dworecki, K. ; Sęk, S. ; Kwinkowski, M. ; Kaca, W.

Thin solid films, 2013-12, Vol.548, p.343-348 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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6
The changes in work function of group Ib and VIII metals on xenon adsorption, determined by field electron and photoelectron emission
The changes in work function of group Ib and VIII metals on xenon adsorption, determined by field electron and photoelectron emission
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The changes in work function of group Ib and VIII metals on xenon adsorption, determined by field electron and photoelectron emission

Nieuwenhuys, B.E. ; Bouwman, R. ; Sachtler, W.M.H.

Thin solid films, 1974-03, Vol.21 (1), p.51-58 [Periódico revisado por pares]

Elsevier B.V

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