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Material Type: Artigo
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micrOMEGAs_3: A program for calculating dark matter observablesBélanger, G. ; Boudjema, F. ; Pukhov, A. ; Semenov, A.Computer physics communications, 2014-03, Vol.185 (3), p.960-985 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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2 |
Material Type: Artigo
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An Ensemble of Fine-Tuned Convolutional Neural Networks for Medical Image ClassificationKumar, Ashnil ; Kim, Jinman ; Lyndon, David ; Fulham, Michael ; Feng, DaganIEEE journal of biomedical and health informatics, 2017-01, Vol.21 (1), p.31-40 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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Deep EHR: A Survey of Recent Advances in Deep Learning Techniques for Electronic Health Record (EHR) AnalysisShickel, Benjamin ; Tighe, Patrick James ; Bihorac, Azra ; Rashidi, ParisaIEEE journal of biomedical and health informatics, 2018-09, Vol.22 (5), p.1589-1604 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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4 |
Material Type: Artigo
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Automated Breast Ultrasound Lesions Detection Using Convolutional Neural NetworksYap, Moi Hoon ; Pons, Gerard ; Marti, Joan ; Ganau, Sergi ; Sentis, Melcior ; Zwiggelaar, Reyer ; Davison, Adrian K. ; Marti, RobertIEEE journal of biomedical and health informatics, 2018-07, Vol.22 (4), p.1218-1226 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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5 |
Material Type: Artigo
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Deep Learning for Health InformaticsRavi, Daniele ; Charence Wong ; Deligianni, Fani ; Berthelot, Melissa ; Andreu-Perez, Javier ; Lo, Benny ; Guang-Zhong YangIEEE journal of biomedical and health informatics, 2017-01, Vol.21 (1), p.4-21 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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Recent developments in the ABINIT software packageGonze, X. ; Jollet, F. ; Abreu Araujo, F. ; Adams, D. ; Amadon, B. ; Applencourt, T. ; Audouze, C. ; Beuken, J.-M. ; Bieder, J. ; Bokhanchuk, A. ; Bousquet, E. ; Bruneval, F. ; Caliste, D. ; Côté, M. ; Dahm, F. ; Da Pieve, F. ; Delaveau, M. ; Di Gennaro, M. ; Dorado, B. ; Espejo, C. ; Geneste, G. ; Genovese, L. ; Gerossier, A. ; Giantomassi, M. ; Gillet, Y. ; Hamann, D.R. ; He, L. ; Jomard, G. ; Laflamme Janssen, J. ; Le Roux, S. ; Levitt, A. ; Lherbier, A. ; Liu, F. ; Lukačević, I. ; Martin, A. ; Martins, C. ; Oliveira, M.J.T. ; Poncé, S. ; Pouillon, Y. ; Rangel, T. ; Rignanese, G.-M. ; Romero, A.H. ; Rousseau, B. ; Rubel, O. ; Shukri, A.A. ; Stankovski, M. ; Torrent, M. ; Van Setten, M.J. ; Van Troeye, B. ; Verstraete, M.J. ; Waroquiers, D. ; Wiktor, J. ; Xu, B. ; Zhou, A. ; Zwanziger, J.W.Computer physics communications, 2016-08, Vol.205, p.106-131 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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Material Type: Artigo
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Deep Learning for Fall Detection: Three-Dimensional CNN Combined With LSTM on Video Kinematic DataLu, Na ; Wu, Yidan ; Feng, Li ; Song, JinboIEEE journal of biomedical and health informatics, 2019-01, Vol.23 (1), p.314-323 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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Seven-Point Checklist and Skin Lesion Classification Using Multitask Multimodal Neural NetsKawahara, Jeremy ; Daneshvar, Sara ; Argenziano, Giuseppe ; Hamarneh, GhassanIEEE journal of biomedical and health informatics, 2019-03, Vol.23 (2), p.538-546 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
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9 |
Material Type: Artigo
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Design of Secure and Lightweight Authentication Protocol for Wearable Devices EnvironmentDas, Ashok Kumar ; Wazid, Mohammad ; Kumar, Neeraj ; Khan, Muhammad Khurram ; Choo, Kim-Kwang Raymond ; Park, YoungHoIEEE journal of biomedical and health informatics, 2018-07, Vol.22 (4), p.1310-1322 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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10 |
Material Type: Artigo
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Low-Dose CT With a Residual Encoder-Decoder Convolutional Neural NetworkChen, Hu ; Zhang, Yi ; Kalra, Mannudeep K. ; Lin, Feng ; Chen, Yang ; Liao, Peixi ; Zhou, Jiliu ; Wang, GeIEEE transactions on medical imaging, 2017-12, Vol.36 (12), p.2524-2535United States: IEEETexto completo disponível |