Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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Agile Requirements Engineering: A systematic literature reviewSchön, Eva-Maria ; Thomaschewski, Jörg ; Escalona, María JoséComputer standards and interfaces, 2017-01, Vol.49, p.79-91 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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2 |
Material Type: Artigo
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The ARM Scalable Vector ExtensionStephens, Nigel ; Biles, Stuart ; Boettcher, Matthias ; Eapen, Jacob ; Eyole, Mbou ; Gabrielli, Giacomo ; Horsnell, Matt ; Magklis, Grigorios ; Martinez, Alejandro ; Premillieu, Nathanael ; Reid, Alastair ; Rico, Alejandro ; Walker, PaulIEEE MICRO, 2017-03, Vol.37 (2), p.26-39 [Periódico revisado por pares]Los Alamitos: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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Models@ run.timeBlair, G. ; Bencomo, N. ; France, R.B.Computer (Long Beach, Calif.), 2009-10, Vol.42 (10), p.22-27 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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4 |
Material Type: Artigo
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Defect Prediction With Semantics and Context Features of Codes Based on Graph Representation LearningXu, Jiaxi ; Wang, Fei ; Ai, JunIEEE transactions on reliability, 2021-06, Vol.70 (2), p.613-625 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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5 |
Material Type: Artigo
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Assured Autonomy Through Combinatorial MethodsKuhn, D. Richard ; Raunak, M. S. ; Kacker, Raghu N. ; Chandrasekaran, Jaganmohan ; Lanus, Erin ; Cody, Tyler ; Freeman, Laura ; Michael, James BretComputer (Long Beach, Calif.), 2024-05, Vol.57 (5), p.86-90 [Periódico revisado por pares]IEEETexto completo disponível |
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Material Type: Artigo
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CNN-Based Automatic Prioritization of Bug ReportsUmer, Qasim ; Liu, Hui ; Illahi, InamIEEE transactions on reliability, 2020-12, Vol.69 (4), p.1341-1354 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Machine Learning Applied to Software Testing: A Systematic Mapping StudyDurelli, Vinicius H. S. ; Durelli, Rafael S. ; Borges, Simone S. ; Endo, Andre T. ; Eler, Marcelo M. ; Dias, Diego R. C. ; Guimaraes, Marcelo P.IEEE transactions on reliability, 2019-09, Vol.68 (3), p.1189-1212 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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T-CREST: Time-predictable multi-core architecture for embedded systemsSchoeberl, Martin ; Abbaspour, Sahar ; Akesson, Benny ; Audsley, Neil ; Capasso, Raffaele ; Garside, Jamie ; Goossens, Kees ; Goossens, Sven ; Hansen, Scott ; Heckmann, Reinhold ; Hepp, Stefan ; Huber, Benedikt ; Jordan, Alexander ; Kasapaki, Evangelia ; Knoop, Jens ; Li, Yonghui ; Prokesch, Daniel ; Puffitsch, Wolfgang ; Puschner, Peter ; Rocha, André ; Silva, Cláudio ; Sparsø, Jens ; Tocchi, AlessandroJournal of systems architecture, 2015-10, Vol.61 (9), p.449-471 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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Material Type: Artigo
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Dynamic Software Product LinesHallsteinsen, S. ; Hinchey, M. ; Sooyong Park ; Schmid, K.Computer (Long Beach, Calif.), 2008-04, Vol.41 (4), p.93-95 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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10 |
Material Type: Artigo
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Globalizing Modeling LanguagesCombemale, Benoit ; DeAntoni, Julien ; Baudry, Benoit ; France, Robert B. ; Jezequel, Jean-Marc ; Gray, JeffComputer (Long Beach, Calif.), 2014-06, Vol.47 (6), p.68-71 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |