Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Artigo
|
Short infrared wavelength quantum cascade detectors based on m-plane ZnO/ZnMgO quantum wellsJollivet, A. ; Hinkov, B. ; Pirotta, S. ; Hoang, H. ; Derelle, S. ; Jaeck, J. ; Tchernycheva, M. ; Colombelli, R. ; Bousseksou, A. ; Hugues, M. ; Le Biavan, N. ; Tamayo-Arriola, J. ; Montes Bajo, M. ; Rigutti, L. ; Hierro, A. ; Strasser, G. ; Chauveau, J.-M. ; Julien, F. H.Applied physics letters, 2018-12, Vol.113 (25), p.251104-1 - 251104-5 [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
|
2 |
Material Type: Artigo
|
Transport of indirect excitons in ZnO quantum wellsKuznetsova, Y Y ; Fedichkin, F ; Andreakou, P ; Calman, E V ; Butov, L V ; Lefebvre, P ; Bretagnon, T ; Guillet, T ; Vladimirova, M ; Morhain, C ; Chauveau, J-MOptics letters, 2015-08, Vol.40 (15), p.3667-3670 [Periódico revisado por pares]United States: Optical Society of America - OSA PublishingSem texto completo |
|
3 |
Material Type: Artigo
|
Access to residual carrier concentration in ZnO nanowires by calibrated scanning spreading resistance microscopyWang, L. ; Chauveau, J. M. ; Brenier, R. ; Sallet, V. ; Jomard, F. ; Sartel, C. ; Brémond, G.Applied physics letters, 2016-03, Vol.108 (13) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
|
4 |
Material Type: Artigo
|
Nanoscale calibration of n-type ZnO staircase structures by scanning capacitance microscopyWang, L. ; Laurent, J. ; Chauveau, J. M. ; Sallet, V. ; Jomard, F. ; Brémond, G.Applied physics letters, 2015-11, Vol.107 (19) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
|
5 |
Material Type: Artigo
|
Ga-doping of nonpolar m-plane ZnMgO with high Mg contentsTamayo-Arriola, J. ; Montes Bajo, M. ; Le Biavan, N. ; Lefebvre, D. ; Kurtz, A. ; Ulloa, J.M. ; Hugues, M. ; Chauveau, J.M. ; Hierro, A.Journal of alloys and compounds, 2018-10, Vol.766, p.436-441 [Periódico revisado por pares]Lausanne: Elsevier B.VTexto completo disponível |