Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Quantification of the bond-angle dispersion by Raman spectroscopy and the strain energy of amorphous siliconRoura, P. ; Farjas, J. ; Roca i Cabarrocas, P.Journal of applied physics, 2008-10, Vol.104 (7) [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
2 |
Material Type: Artigo
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Raman scattering investigation on structural and chemical disorder generated by laser ablation and mechanical microindentations of InSb single crystalMyriam Rincon Joya Paulo Sérgio Pizani; Renato Goulart Jasinevicius; Ricardo Elgul Samad; Wagner de Rossi; Nilson Dias Vieira JuniorJournal of Applied Physics Melville v. 100, n. 5, p. 1-4, Sep. 2006Melville 2006Acesso online |
3 |
Material Type: Artigo
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Raman scattering investigation on structural and chemical disorder generated by laser ablation and mechanical microindentations of InSb single crystalMyriam Rincon Joya Paulo Sérgio Pizani; Renato Goulart Jasinevicius; Ricardo Elgul Samad; Wagner de Rossi; Nilson Dias Vieira JuniorJournal of Applied Physics Melville v. 100, n. 5, p. 1-4, Sep. 2006Melville 2006Acesso online |
4 |
Material Type: Artigo
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Quasi real-time Raman studies on the growth of Cu–In–S thin filmsRudigier, Eveline ; Barcones, Beatriz ; Luck, Ilka ; Jawhari-Colin, T. ; Pérez-Rodrı́guez, Alejandro ; Scheer, RolandJournal of applied physics, 2004-05, Vol.95 (9), p.5153-5158 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
5 |
Material Type: Artigo
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Spectroscopic study of Nd-doped amorphous SiN filmsC. T. M. Ribeiro Máximo Siu Li; Antonio Ricardo ZanattaJournal of Applied Physics Melville v. 96, n. 2, p. 1068-1073, Jul. 2004Melville 2004Localização: IFSC - Inst. Física de São Carlos (PROD009866 )(Acessar) |
6 |
Material Type: Artigo
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Kerr measurements on single-domain SrRuO3 thin filmsHerranz, G. ; Dix, N. ; Sánchez, F. ; Martínez, B. ; Fontcuberta, J. ; García-Cuenca, M. V. ; Ferrater, C. ; Varela, M. ; Hrabovsky, D. ; Fert, A. R.Journal of applied physics, 2005-05, Vol.97 (10) [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
7 |
Material Type: Artigo
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Polymorphous Si thin films from radio frequency plasmas of SiH4 diluted in Ar: A study by transmission electron microscopy and Raman spectroscopyViera, G. ; Huet, S. ; Bertran, E. ; Boufendi, L.Journal of applied physics, 2001-10, Vol.90 (8), p.4272-4280 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
8 |
Material Type: Artigo
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Effect of stress and composition on the Raman spectra of etch-stop SiGeB layersPérez-Rodríguez, A. ; Romano-Rodríguez, A. ; Cabezas, R. ; Morante, J. R. ; Jawhari, T. ; Hunt, C. E.Journal of applied physics, 1996-11, Vol.80 (10), p.5736-5741 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
9 |
Material Type: Artigo
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Blackbody emission under laser excitation of silicon nanopowder produced by plasma-enhanced chemical-vapor depositionCosta, J. ; Roura, P. ; Morante, J. R. ; Bertran, E.Journal of applied physics, 1998-06, Vol.83 (12), p.7879-7885 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
10 |
Material Type: Artigo
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Spectroscopic characterization of phases formed by high-dose carbon ion implantation in siliconSerre, C. ; Pérez-Rodríguez, A. ; Romano-Rodríguez, A. ; Morante, J. R. ; Kögler, R. ; Skorupa, W.Journal of applied physics, 1995-04, Vol.77 (7), p.2978-2984 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |