Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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Low-Frequency Noise in Vertical InAs Nanowire FETsPersson, Karl-Magnus ; Lind, Erik ; Dey, Anil W ; Thelander, Claes ; Sjoland, Henrik ; Wernersson, Lars-ErikIEEE electron device letters, 2010-05, Vol.31 (5), p.428-430 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Bias-temperature stress of Al on porous low- k dielectricsHe, Ming ; Li, Huafang ; Wang, Pei-I ; Lu, Toh-MingMicroelectronics and reliability, 2011-08, Vol.51 (8), p.1342-1345 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
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Material Type: Artigo
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MICROWAVE DIELECTRIC PROPERTIES OF Mn:BST AND PST THIN-FILMSSUBRAMANYAM, GURU ; CHEN, CHONGLIN ; DEY, SANDWIPIntegrated ferroelectrics, 2005-12, Vol.77 (1), p.189-197 [Periódico revisado por pares]Taylor & Francis GroupTexto completo disponível |