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A close look at dose: Toward L-edge XAS spectral uniformity, dose quantification and prediction of metal ion photoreduction
A close look at dose: Toward L-edge XAS spectral uniformity, dose quantification and prediction of metal ion photoreduction
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A close look at dose: Toward L-edge XAS spectral uniformity, dose quantification and prediction of metal ion photoreduction

van Schooneveld, M.M. ; DeBeer, S.

Journal of electron spectroscopy and related phenomena, 2015-01, Vol.198, p.31-56 [Periódico revisado por pares]

Elsevier B.V

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2
Reflections on hard X-ray photon-in/photon-out spectroscopy for electronic structure studies
Reflections on hard X-ray photon-in/photon-out spectroscopy for electronic structure studies
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Reflections on hard X-ray photon-in/photon-out spectroscopy for electronic structure studies

Glatzel, Pieter ; Weng, Tsu-Chien ; Kvashnina, Kristina ; Swarbrick, Janine ; Sikora, Marcin ; Gallo, Erik ; Smolentsev, Nikolay ; Mori, Roberto Alonso

Journal of electron spectroscopy and related phenomena, 2013-06, Vol.188, p.17-25 [Periódico revisado por pares]

Elsevier B.V

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3
The iron L edges: Fe 2p X-ray absorption and electron energy loss spectroscopy
The iron L edges: Fe 2p X-ray absorption and electron energy loss spectroscopy
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The iron L edges: Fe 2p X-ray absorption and electron energy loss spectroscopy

Miedema, Piter S. ; de Groot, Frank M.F.

Journal of electron spectroscopy and related phenomena, 2013-04, Vol.187, p.32-48 [Periódico revisado por pares]

Elsevier B.V

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4
Electronic structure of non-centrosymmetric AgCd2GaS4 and AgCd2GaSe4 single crystals
Electronic structure of non-centrosymmetric AgCd2GaS4 and AgCd2GaSe4 single crystals
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Electronic structure of non-centrosymmetric AgCd2GaS4 and AgCd2GaSe4 single crystals

Bekenev, V.L. ; Bozhko, V.V. ; Parasyuk, O.V. ; Davydyuk, G.E. ; Bulatetska, L.V. ; Fedorchuk, A.O. ; Kityk, I.V. ; Khyzhun, O.Y.

Journal of electron spectroscopy and related phenomena, 2012-12, Vol.185 (12), p.559-566 [Periódico revisado por pares]

Elsevier B.V

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5
Hard X-ray photoemission with angular resolution and standing-wave excitation
Hard X-ray photoemission with angular resolution and standing-wave excitation
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Hard X-ray photoemission with angular resolution and standing-wave excitation

Fadley, Charles S.

Journal of electron spectroscopy and related phenomena, 2013-10, Vol.190, p.165-179 [Periódico revisado por pares]

Elsevier B.V

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6
Role of resonant inelastic X-ray scattering in high-resolution core-level spectroscopy of actinide materials
Role of resonant inelastic X-ray scattering in high-resolution core-level spectroscopy of actinide materials
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Role of resonant inelastic X-ray scattering in high-resolution core-level spectroscopy of actinide materials

Kvashnina, K.O. ; Kvashnin, Y.O. ; Butorin, S.M.

Journal of electron spectroscopy and related phenomena, 2014-06, Vol.194, p.27-36 [Periódico revisado por pares]

Elsevier B.V

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7
The development of in situ photon-in/photon-out soft X-ray spectroscopy on beamline 7.0.1 at the ALS
The development of in situ photon-in/photon-out soft X-ray spectroscopy on beamline 7.0.1 at the ALS
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The development of in situ photon-in/photon-out soft X-ray spectroscopy on beamline 7.0.1 at the ALS

Guo, Jinghua

Journal of electron spectroscopy and related phenomena, 2013-06, Vol.188, p.71-78 [Periódico revisado por pares]

Elsevier B.V

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8
RIXS investigations of liquids, solutions, and liquid/solid interfaces
RIXS investigations of liquids, solutions, and liquid/solid interfaces
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RIXS investigations of liquids, solutions, and liquid/solid interfaces

Weinhardt, L. ; Blum, M. ; Fuchs, O. ; Benkert, A. ; Meyer, F. ; Bär, M. ; Denlinger, J.D. ; Yang, W. ; Reinert, F. ; Heske, C.

Journal of electron spectroscopy and related phenomena, 2013-06, Vol.188, p.111-120 [Periódico revisado por pares]

Elsevier B.V

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9
XPS characterisation of in situ treated lanthanum oxide and hydroxide using tailored charge referencing and peak fitting procedures
XPS characterisation of in situ treated lanthanum oxide and hydroxide using tailored charge referencing and peak fitting procedures
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XPS characterisation of in situ treated lanthanum oxide and hydroxide using tailored charge referencing and peak fitting procedures

Sunding, M.F. ; Hadidi, K. ; Diplas, S. ; Løvvik, O.M. ; Norby, T.E. ; Gunnæs, A.E.

Journal of electron spectroscopy and related phenomena, 2011-07, Vol.184 (7), p.399-409 [Periódico revisado por pares]

Elsevier B.V

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10
Development of high lateral and wide angle resolved hard X-ray photoemission spectroscopy at BL47XU in SPring-8
Development of high lateral and wide angle resolved hard X-ray photoemission spectroscopy at BL47XU in SPring-8
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Development of high lateral and wide angle resolved hard X-ray photoemission spectroscopy at BL47XU in SPring-8

Ikenaga, Eiji ; Kobata, Masaaki ; Matsuda, Hiroyuki ; Sugiyama, Takeharu ; Daimon, Hiroshi ; Kobayashi, Keisuke

Journal of electron spectroscopy and related phenomena, 2013-10, Vol.190, p.180-187 [Periódico revisado por pares]

Elsevier B.V

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