Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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11 |
Material Type: Ata de Congresso
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Reliability design of a calibration laboratory automation softwareTasic, T. ; Bojkovski, J. ; Pusnik, I. ; Drnovsek, J.Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.600-601IEEETexto completo disponível |
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12 |
Material Type: Ata de Congresso
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International comparison of 50/60 Hz power (1996-1999)Oldham, N. ; Nelson, T. ; Bergeest, R. ; Carranza, R. ; Gibbes, M. ; Jones, K. ; Kyriazis, G. ; Laiz, H. ; Liu, L. ; Lu, Z. ; Pogliano, U. ; Rydler, K. ; Shapiro, E. ; So, E. ; Temba, M. ; Wright, P.Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.66-67IEEETexto completo disponível |
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13 |
Material Type: Ata de Congresso
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Least-squares fitting of the current drift for a DVM-based comparison methodde Aguilar, J.D. ; Zorzano, R. ; Rodriguez, M.Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.371-372IEEETexto completo disponível |
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14 |
Material Type: Ata de Congresso
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International comparison of a pulse calibrator used in high voltage impulse calibrationYi Li ; Rungis, J. ; McComb, T.R. ; Lucas, W.Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.60-61IEEETexto completo disponível |
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15 |
Material Type: Ata de Congresso
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Determination of the Avogadro constant from precision density measurements on a silicon sphereKenny, M.J. ; Walsh, C.J. ; Leistner, A.J. ; Fen, K. ; Giardini, W.J. ; Wielunski, L.S. ; Ward, B.R.Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.184-185IEEETexto completo disponível |
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16 |
Material Type: Ata de Congresso
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International comparison of a resistive divider at 100 kV DCLi, Y. ; Rungis, J. ; Jing, T. ; Su, T.H. ; Chen, I.P. ; Lee, D. ; Shimizu, K.Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.62-63IEEETexto completo disponível |
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17 |
Material Type: Ata de Congresso
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North American interlaboratory comparison of 10 V Josephson voltage standardsDeaver, D. ; Miller, W.B. ; Pardo, L. ; Jaeger, K. ; Plowman, D. ; Hamilton, C.A.Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.249-250IEEETexto completo disponível |
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18 |
Material Type: Ata de Congresso
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Frequency dependence of the AC quantum Hall effect; comparison of data from two laboratoriesGiblin, S.P. ; Awan, S.A. ; Williams, J.M. ; Schurr, J. ; Melcher, J. ; Von Campenhausen, A. ; Pierz, K. ; Hein, G.Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.158-159IEEETexto completo disponível |
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19 |
Material Type: Ata de Congresso
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Quick comparison of QHR systems using a 100 ohm transfer resistorSatrapinski, A. ; Seppa, H. ; Schumacher, B. ; Warnecke, P. ; Delahaye, F. ; Poirier, W. ; Piquemal, F.Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.560-561IEEETexto completo disponível |
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20 |
Material Type: Ata de Congresso
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Quantum Hall sample characterizationSakarya, H. ; Rietveld, G.Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.562-563IEEETexto completo disponível |