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1
Maximum-Likelihood Methods for Processing Signals From Gamma-Ray Detectors
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Maximum-Likelihood Methods for Processing Signals From Gamma-Ray Detectors

Barrett, H.H. ; Hunter, W.C.J. ; Miller, B.W. ; Moore, S.K. ; Yichun Chen ; Furenlid, L.R.

IEEE transactions on nuclear science, 2009-06, Vol.56 (3), p.725-735 [Periódico revisado por pares]

United States: IEEE

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2
Calibration Method for ML Estimation of 3D Interaction Position in a Thick Gamma-Ray Detector
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Calibration Method for ML Estimation of 3D Interaction Position in a Thick Gamma-Ray Detector

Hunter, W. ; Barrett, H.H. ; Furenlid, L.R.

IEEE transactions on nuclear science, 2009-02, Vol.56 (1), p.189-196 [Periódico revisado por pares]

United States: IEEE

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3
Use of Cramer-Rao Lower Bound for Performance Evaluation of Different Monolithic Crystal PET Detector Designs
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Use of Cramer-Rao Lower Bound for Performance Evaluation of Different Monolithic Crystal PET Detector Designs

Xiaoli Li ; Hunter, W. C. J. ; Lewellen, T. K. ; Miyaoka, R. S.

IEEE transactions on nuclear science, 2012-02, Vol.59 (1), p.3-12 [Periódico revisado por pares]

United States: IEEE

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4
Efficient Prompt Scintillation and Fast Neutron-Gamma Ray Discrimination Using Amorphous Blends of Difluorenylsilane Organic Glass and In Situ Polymerized Vinyltoluene
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Efficient Prompt Scintillation and Fast Neutron-Gamma Ray Discrimination Using Amorphous Blends of Difluorenylsilane Organic Glass and In Situ Polymerized Vinyltoluene

Myllenbeck, Nicholas R. ; Carlson, Joseph S. ; Hunter, McKenzie A. ; Tran, Huu M. ; Benin, Annabelle I. ; Feng, Patrick L.

IEEE transactions on nuclear science, 2021-09, Vol.68 (9), p.2400-2406 [Periódico revisado por pares]

New York: IEEE

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5
Microchannel Plate Detection Efficiency to Monoenergetic Photons Between 0.66 and 20 MeV
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Microchannel Plate Detection Efficiency to Monoenergetic Photons Between 0.66 and 20 MeV

Blase, Ryan C. ; Benke, Roland R. ; Pickens, Keith S. ; Waite, J. Hunter

IEEE transactions on nuclear science, 2018-04, Vol.65 (4), p.980-988 [Periódico revisado por pares]

New York: IEEE

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6
Development and Characterization of a High-Energy Neutron Time-of-Flight Imaging System
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Development and Characterization of a High-Energy Neutron Time-of-Flight Imaging System

Madden, Amanda C. ; Schirato, Richard C. ; Swift, Alicia L. ; Cutler, Theresa E. ; Mayo, Douglas R. ; Hunter, James F.

IEEE transactions on nuclear science, 2017-07, Vol.64 (7), p.1810-1816 [Periódico revisado por pares]

New York: IEEE

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7
Transparent Ceramic Garnet Gamma-Ray Spectrometer With Directionality
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Transparent Ceramic Garnet Gamma-Ray Spectrometer With Directionality

Swanberg, Erik L. ; Cherepy, Nerine J. ; Wihl, Brian M. ; Beck, Patrick R. ; Seeley, Zachary M. ; Hunter, Steven L. ; Fisher, Scott E. ; Payne, Stephen A. ; Kindem, Joel

IEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.2303-2309 [Periódico revisado por pares]

New York: IEEE

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8
Resolution Properties of a Prototype Continuous Miniature Crystal Element (cMiCE) Scanner
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Resolution Properties of a Prototype Continuous Miniature Crystal Element (cMiCE) Scanner

Miyaoka, R. S. ; Xiaoli Li ; Hunter, W. ; Pierce, L. A. ; McDougald, W. ; Kinahan, P. E. ; Lewellen, T. K.

IEEE transactions on nuclear science, 2011-10, Vol.58 (5), p.2244-2249 [Periódico revisado por pares]

United States: IEEE

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9
Solution-Grown Rubrene Crystals as Radiation Detecting Devices
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Solution-Grown Rubrene Crystals as Radiation Detecting Devices

Carman, Leslie ; Martinez, H. Paul ; Voss, Lars ; Hunter, Steven ; Beck, Patrick ; Zaitseva, Natalia ; Payne, Stephen A. ; Irkhin, Pavel ; Hyun Ho Choi ; Podzorov, Vitaly

IEEE transactions on nuclear science, 2017-02, Vol.64 (2), p.781-788 [Periódico revisado por pares]

New York: IEEE

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10
Nonproportionality of Scintillator Detectors. III. Temperature Dependence Studies
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Nonproportionality of Scintillator Detectors. III. Temperature Dependence Studies

Payne, Stephen A. ; Hunter, Steven ; Ahle, Larry ; Cherepy, Nerine J. ; Swanberg, Erik

IEEE transactions on nuclear science, 2014-10, Vol.61 (5), p.2771-2777 [Periódico revisado por pares]

New York: IEEE

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