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Calibration Method for ML Estimation of 3D Interaction Position in a Thick Gamma-Ray Detector
Calibration Method for ML Estimation of 3D Interaction Position in a Thick Gamma-Ray Detector
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Calibration Method for ML Estimation of 3D Interaction Position in a Thick Gamma-Ray Detector

Hunter, W. ; Barrett, H.H. ; Furenlid, L.R.

IEEE transactions on nuclear science, 2009-02, Vol.56 (1), p.189-196 [Periódico revisado por pares]

United States: IEEE

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2
Efficient Prompt Scintillation and Fast Neutron-Gamma Ray Discrimination Using Amorphous Blends of Difluorenylsilane Organic Glass and In Situ Polymerized Vinyltoluene
Efficient Prompt Scintillation and Fast Neutron-Gamma Ray Discrimination Using Amorphous Blends of Difluorenylsilane Organic Glass and In Situ Polymerized Vinyltoluene
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Efficient Prompt Scintillation and Fast Neutron-Gamma Ray Discrimination Using Amorphous Blends of Difluorenylsilane Organic Glass and In Situ Polymerized Vinyltoluene

Myllenbeck, Nicholas R. ; Carlson, Joseph S. ; Hunter, McKenzie A. ; Tran, Huu M. ; Benin, Annabelle I. ; Feng, Patrick L.

IEEE transactions on nuclear science, 2021-09, Vol.68 (9), p.2400-2406 [Periódico revisado por pares]

New York: IEEE

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Microchannel Plate Detection Efficiency to Monoenergetic Photons Between 0.66 and 20 MeV
Microchannel Plate Detection Efficiency to Monoenergetic Photons Between 0.66 and 20 MeV
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Microchannel Plate Detection Efficiency to Monoenergetic Photons Between 0.66 and 20 MeV

Blase, Ryan C. ; Benke, Roland R. ; Pickens, Keith S. ; Waite, J. Hunter

IEEE transactions on nuclear science, 2018-04, Vol.65 (4), p.980-988 [Periódico revisado por pares]

New York: IEEE

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Solution-Grown Rubrene Crystals as Radiation Detecting Devices
Solution-Grown Rubrene Crystals as Radiation Detecting Devices
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Solution-Grown Rubrene Crystals as Radiation Detecting Devices

Carman, Leslie ; Martinez, H. Paul ; Voss, Lars ; Hunter, Steven ; Beck, Patrick ; Zaitseva, Natalia ; Payne, Stephen A. ; Irkhin, Pavel ; Hyun Ho Choi ; Podzorov, Vitaly

IEEE transactions on nuclear science, 2017-02, Vol.64 (2), p.781-788 [Periódico revisado por pares]

New York: IEEE

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