Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Light-Sharing Interface for dMiCE Detectors Using Sub-Surface Laser EngravingHunter, William C. J. ; Miyaoka, Robert S. ; MacDonald, Lawrence ; McDougald, Wendy ; Lewellen, Thomas K.IEEE transactions on nuclear science, 2015-02, Vol.62 (1), p.27-35 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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Material Type: Artigo
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Efficient Prompt Scintillation and Fast Neutron-Gamma Ray Discrimination Using Amorphous Blends of Difluorenylsilane Organic Glass and In Situ Polymerized VinyltolueneMyllenbeck, Nicholas R. ; Carlson, Joseph S. ; Hunter, McKenzie A. ; Tran, Huu M. ; Benin, Annabelle I. ; Feng, Patrick L.IEEE transactions on nuclear science, 2021-09, Vol.68 (9), p.2400-2406 [Periódico revisado por pares]New York: IEEETexto completo disponível |
3 |
Material Type: Artigo
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Development of Transparent Ceramic Ce-Doped Gadolinium Garnet Gamma SpectrometersCherepy, N. J. ; Seeley, Z. M. ; Payne, S. A. ; Beck, P. R. ; Drury, O. B. ; O'Neal, S. P. ; Figueroa, K. M. ; Hunter, S. ; Ahle, L. ; Thelin, P. A. ; Stefanik, T. ; Kindem, J.IEEE transactions on nuclear science, 2013-06, Vol.60 (3), p.2330-2335 [Periódico revisado por pares]IEEETexto completo disponível |
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Material Type: Artigo
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Transparent Ceramic Garnet Gamma-Ray Spectrometer With DirectionalitySwanberg, Erik L. ; Cherepy, Nerine J. ; Wihl, Brian M. ; Beck, Patrick R. ; Seeley, Zachary M. ; Hunter, Steven L. ; Fisher, Scott E. ; Payne, Stephen A. ; Kindem, JoelIEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.2303-2309 [Periódico revisado por pares]New York: IEEETexto completo disponível |
5 |
Material Type: Artigo
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Solution-Grown Rubrene Crystals as Radiation Detecting DevicesCarman, Leslie ; Martinez, H. Paul ; Voss, Lars ; Hunter, Steven ; Beck, Patrick ; Zaitseva, Natalia ; Payne, Stephen A. ; Irkhin, Pavel ; Hyun Ho Choi ; Podzorov, VitalyIEEE transactions on nuclear science, 2017-02, Vol.64 (2), p.781-788 [Periódico revisado por pares]New York: IEEETexto completo disponível |