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1
Frequency dependence of the AC quantum Hall effect; comparison of data from two laboratories
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Ata de Congresso
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Frequency dependence of the AC quantum Hall effect; comparison of data from two laboratories

Giblin, S.P. ; Awan, S.A. ; Williams, J.M. ; Schurr, J. ; Melcher, J. ; Von Campenhausen, A. ; Pierz, K. ; Hein, G.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.158-159

IEEE

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2
High value resistance standards at ETL
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Ata de Congresso
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High value resistance standards at ETL

Kinoshita, J. ; Nakanishi, M.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.293-294

IEEE

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3
A multi-frequency 4-terminal-pair AC bridge
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Ata de Congresso
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A multi-frequency 4-terminal-pair AC bridge

Jeffery, A. ; Shields, J.Q. ; Shields, S.H.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.437-438

IEEE

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4
Microwave interaction of temperature compensation thermistors in thermistor mounts
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Ata de Congresso
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Microwave interaction of temperature compensation thermistors in thermistor mounts

Zhang, T. ; Peters, J.E.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.656-657

IEEE

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5
Calibration of ac current shunts
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Ata de Congresso
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Calibration of ac current shunts

Jones, R.G. ; Clarkson, P. ; Wheaton, A.J.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.492-493

IEEE

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6
Development and uncertainty estimation of bridges for the link between capacitance and the QHR at 1 kHz
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Ata de Congresso
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Development and uncertainty estimation of bridges for the link between capacitance and the QHR at 1 kHz

Nakamura, Y. ; Nakanishi, M. ; Sakamoto, Y. ; Endo, T.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.431-432

IEEE

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7
Influence of connecting cables on the measurement uncertainty in calibration of resistance thermometers
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Ata de Congresso
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Influence of connecting cables on the measurement uncertainty in calibration of resistance thermometers

Bojkovski, J. ; Bergelj, F. ; Pusnik, I. ; Drnovsek, J.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.301-302

IEEE

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8
Automated self-calibration resistive divider for 10 V to 1 kV
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Automated self-calibration resistive divider for 10 V to 1 kV

Forest Shih-Sen Chien ; I-Pao Chen ; Kai-Jan Lin

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.365-366

IEEE

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