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Least-squares fitting of the current drift for a DVM-based comparison method
Least-squares fitting of the current drift for a DVM-based comparison method
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Ata de Congresso 		Adicionar ao Meu Espaço

Least-squares fitting of the current drift for a DVM-based comparison method

de Aguilar, J.D. ; Zorzano, R. ; Rodriguez, M.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.371-372

IEEE

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2
International comparison of a resistive divider at 100 kV DC
International comparison of a resistive divider at 100 kV DC
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International comparison of a resistive divider at 100 kV DC

Li, Y. ; Rungis, J. ; Jing, T. ; Su, T.H. ; Chen, I.P. ; Lee, D. ; Shimizu, K.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.62-63

IEEE

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3
North American interlaboratory comparison of 10 V Josephson voltage standards
North American interlaboratory comparison of 10 V Josephson voltage standards
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North American interlaboratory comparison of 10 V Josephson voltage standards

Deaver, D. ; Miller, W.B. ; Pardo, L. ; Jaeger, K. ; Plowman, D. ; Hamilton, C.A.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.249-250

IEEE

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4
Frequency dependence of the AC quantum Hall effect; comparison of data from two laboratories
Frequency dependence of the AC quantum Hall effect; comparison of data from two laboratories
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Frequency dependence of the AC quantum Hall effect; comparison of data from two laboratories

Giblin, S.P. ; Awan, S.A. ; Williams, J.M. ; Schurr, J. ; Melcher, J. ; Von Campenhausen, A. ; Pierz, K. ; Hein, G.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.158-159

IEEE

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5
Quick comparison of QHR systems using a 100 ohm transfer resistor
Quick comparison of QHR systems using a 100 ohm transfer resistor
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Quick comparison of QHR systems using a 100 ohm transfer resistor

Satrapinski, A. ; Seppa, H. ; Schumacher, B. ; Warnecke, P. ; Delahaye, F. ; Poirier, W. ; Piquemal, F.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.560-561

IEEE

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6
Quantum Hall sample characterization
Quantum Hall sample characterization
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Quantum Hall sample characterization

Sakarya, H. ; Rietveld, G.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.562-563

IEEE

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7
Improvements of the NMi VSL HF AC-DC transfer facilities
Improvements of the NMi VSL HF AC-DC transfer facilities
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Improvements of the NMi VSL HF AC-DC transfer facilities

van Mullem, C.J. ; Dessens, J.T.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.381-382

IEEE

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8
Calibration of a standard resistance using a standard platinum resistance thermometer
Calibration of a standard resistance using a standard platinum resistance thermometer
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Calibration of a standard resistance using a standard platinum resistance thermometer

Valencia-Rodriguez, J. ; Figueroa-Estrada, J.M. ; Escamilla-Esquivel, A. ; Martinez-Martinez, S. ; Martinez-Guerrero, B.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.307-308

IEEE

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9
Calibration of multimeters as voltage ratio standards
Calibration of multimeters as voltage ratio standards
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Calibration of multimeters as voltage ratio standards

Sosso, A. ; Cerri, R.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.375-376

IEEE

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10
Automated DC voltage divider to calibrate voltages up to 1 kV
Automated DC voltage divider to calibrate voltages up to 1 kV
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Automated DC voltage divider to calibrate voltages up to 1 kV

Sakamoto, Y. ; Endo, T. ; Shao, H. ; Matsuzawa, S.

Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), 2000, p.363-364

IEEE

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