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1
Substrate Integrated Waveguide Cavity Resonators for Complex Permittivity Characterization of Materials
Substrate Integrated Waveguide Cavity Resonators for Complex Permittivity Characterization of Materials
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Substrate Integrated Waveguide Cavity Resonators for Complex Permittivity Characterization of Materials

Saeed, K. ; Pollard, R.D. ; Hunter, I.C.

IEEE transactions on microwave theory and techniques, 2008-10, Vol.56 (10), p.2340-2347 [Periódico revisado por pares]

New York, NY: IEEE

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2
Microwave filters-applications and technology
Microwave filters-applications and technology
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Microwave filters-applications and technology

Hunter, I.C. ; Billonet, L. ; Jarry, B. ; Guillon, P.

IEEE transactions on microwave theory and techniques, 2002-03, Vol.50 (3), p.794-805 [Periódico revisado por pares]

New York: IEEE

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3
Dielectric materials, devices, and circuits
Dielectric materials, devices, and circuits
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Dielectric materials, devices, and circuits

Fiedziuszko, S.J. ; Hunter, I.C. ; Itoh, T. ; Kobayashi, Y. ; Nishikawa, T. ; Stitzer, S.N. ; Wakino, K.

IEEE transactions on microwave theory and techniques, 2002-03, Vol.50 (3), p.706-720 [Periódico revisado por pares]

New York: IEEE

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4
Electronically Reconfigurable Microwave Bandpass Filter
Electronically Reconfigurable Microwave Bandpass Filter
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Electronically Reconfigurable Microwave Bandpass Filter

Peng Wen Wong ; Hunter, I.C.

IEEE transactions on microwave theory and techniques, 2009-12, Vol.57 (12), p.3070-3079 [Periódico revisado por pares]

New York: IEEE

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5
A New Class of Low-Loss High-Linearity Electronically Reconfigurable Microwave Filter
A New Class of Low-Loss High-Linearity Electronically Reconfigurable Microwave Filter
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A New Class of Low-Loss High-Linearity Electronically Reconfigurable Microwave Filter

Peng Wen Wong ; Hunter, I.C.

IEEE transactions on microwave theory and techniques, 2008-08, Vol.56 (8), p.1945-1953 [Periódico revisado por pares]

New York, NY: IEEE

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6
Tunable Bandpass and Bandstop Filters Based on Dual-Band Combline Structures
Tunable Bandpass and Bandstop Filters Based on Dual-Band Combline Structures
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Tunable Bandpass and Bandstop Filters Based on Dual-Band Combline Structures

Abunjaileh, A I ; Hunter, I C

IEEE transactions on microwave theory and techniques, 2010-12, Vol.58 (12), p.3710-3719 [Periódico revisado por pares]

New York, NY: IEEE

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7
A Circuit-Theoretic Approach to the Design of Quadruple-Mode Broadband Microstrip Patch Antennas
A Circuit-Theoretic Approach to the Design of Quadruple-Mode Broadband Microstrip Patch Antennas
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A Circuit-Theoretic Approach to the Design of Quadruple-Mode Broadband Microstrip Patch Antennas

Abunjaileh, A.I. ; Hunter, I.C. ; Kemp, A.H.

IEEE transactions on microwave theory and techniques, 2008-04, Vol.56 (4), p.896-900 [Periódico revisado por pares]

New York, NY: IEEE

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8
Coupled electrothermal, electromagnetic, and physical modeling of microwave power FETs
Coupled electrothermal, electromagnetic, and physical modeling of microwave power FETs
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Coupled electrothermal, electromagnetic, and physical modeling of microwave power FETs

Denis, D. ; Snowden, C.M. ; Hunter, I.C.

IEEE transactions on microwave theory and techniques, 2006-06, Vol.54 (6), p.2465-2470 [Periódico revisado por pares]

New York, NY: IEEE

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9
Microwave Parametric Frequency Dividers With Conversion Gain
Microwave Parametric Frequency Dividers With Conversion Gain
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Microwave Parametric Frequency Dividers With Conversion Gain

Heshmati, Z. ; Hunter, I.C. ; Pollard, R.D.

IEEE transactions on microwave theory and techniques, 2007-10, Vol.55 (10), p.2059-2064 [Periódico revisado por pares]

New York, NY: IEEE

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10
Stopband performance improvement of rectangular waveguide filters using stepped-impedance resonators
Stopband performance improvement of rectangular waveguide filters using stepped-impedance resonators
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Stopband performance improvement of rectangular waveguide filters using stepped-impedance resonators

Morelli, M. ; Hunter, I. ; Parry, R. ; Postoyalko, V.

IEEE transactions on microwave theory and techniques, 2002-07, Vol.50 (7), p.1657-1664 [Periódico revisado por pares]

New York: IEEE

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