Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: magazinearticle
|
![]() |
Smart ventilationEaston, PeterMechanical engineering (New York, N.Y. 1919), 2007-12, Vol.129 (12), p.18New York: American Society of Mechanical EngineersTexto completo disponível |
2 |
Material Type: magazinearticle
|
![]() |
Elevator suspension standardMechanical engineering (New York, N.Y. 1919), 2010-11, Vol.132 (11), p.12New York: American Society of Mechanical EngineersTexto completo disponível |
3 |
Material Type: magazinearticle
|
![]() |
Innovation (and Google)Falcioni, John GMechanical engineering (New York, N.Y. 1919), 2006-12, Vol.128 (12), p.4New York: American Society of Mechanical EngineersTexto completo disponível |
4 |
Material Type: magazinearticle
|
![]() |
US science and technology museums - IIBell, T.E.IEEE spectrum, 1995-10, Vol.32 (10), p.48-71New York: IEEETexto completo disponível |
5 |
Material Type: magazinearticle
|
![]() |
International science and technology museums. IIBell, T.E.IEEE spectrum, 1996-06, Vol.33 (6), p.74-83New York: IEEETexto completo disponível |
6 |
Material Type: magazinearticle
|
![]() |
Survey says: science & technology critical to U.S securityKren, LawrenceMachine Design, 2003-09, Vol.75 (17), p.104-104Nashville: Penton Media, Inc., Penton Business Media, Inc. and their subsidiariesTexto completo disponível |
7 |
Material Type: magazinearticle
|
![]() |
International science and technology museums. IBell, T.E.IEEE spectrum, 1996-04, Vol.33 (4), p.39-49New York: IEEETexto completo disponível |
8 |
Material Type: magazinearticle
|
![]() |
Science and Technology Policy: Science FrictionMiller, William HIndustry week, 1992-05, Vol.241 (9), p.54-54Nashville: Endeavor Business MediaTexto completo disponível |
9 |
Material Type: magazinearticle
|
![]() |
Hidden gems - science and technology museumsSix, J MIEEE spectrum, 2005-01, Vol.42 (1), p.70-71Texto completo disponível |
10 |
Material Type: magazinearticle
|
![]() |
The Beckman Institute for Advanced Science and TechnologyBell, T.E.IEEE spectrum, 1996-11, Vol.33 (11), p.54-60New York: IEEETexto completo disponível |