Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Report
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A quantum logic gate for free electronsLöffler, Stefan ; Schachinger, Thomas ; Hartel, Peter ; Lu, Peng-Han ; Dunin-Borkowski, Rafal E. ; Obermair, Martin ; Dries, Manuel ; Gerthsen, Dagmar ; Schattschneider, PeterKarlsruher Institut für Technologie (KIT) 2022Texto completo disponível |
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2 |
Material Type: Report
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Simulating interactions of photons and electrons with matter using Geant4Dissanayake Mudiyanselage, Maleesh Shehan Rathnasiri ; Mishi, Alfred ; Farina, StefanoZenodo 2023Texto completo disponível |
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3 |
Material Type: Report
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Electron beam lithography and pattern transfer on membrane grids for transmission electron microscopyYang, YujiaZenodo 2021Texto completo disponível |
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4 |
Material Type: Report
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Electron Beam Welding of Additively Manufactured Niobium Alloy Heat PipesBrizes, Eric ; Milner, JustinGlenn Research Center 2024Texto completo disponível |
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5 |
Material Type: Report
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Scanning electron microscopy of ibrutinib-induced hair shaft changesAlmeida, Hiram Larangeira de ; Sartori, Debora Sarzi ; Malkoun, Douglas ; Cunha, Carlos Eduardo PoueyAnais brasileiros de dermatologia, 2023, Vol.98 (4), p.520-523Texto completo disponível |
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6 |
Material Type: Report
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Ceramic Capacitor Grain Size Analysis Using Electron Backscatter Diffraction (EBSD)Hodson, Robert F ; Douglas, Susana P ; Green, Christopher M ; Tayon, Wesley A ; Baughman, James M ; Brusse, Jay A ; Leidecker, Henning WLangley Research Center 2023Texto completo disponível |
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7 |
Material Type: Report
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Photoemission and Low Energy Electron Diffraction in SolidsDissanayake Mudiyanselage, Maleesh Shehan Rathnasiri ; Murugesan, VaishnaviZenodo 2022Texto completo disponível |
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8 |
Material Type: Report
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Irradiation with High Energy Electron Beams Increases the Hardness of Metamorphic Copper-Based AlloysDinesh Krishnaa, S ; Sangeeth Kumar, M ; Dhiyaneswaran, J ; Rishi Karthikeyan, V.P ; Saran Rithik, B2024Texto completo disponível |
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9 |
Material Type: Report
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Sporotrichosis: Using scanning electron microscopy to decipher the "blackish-red dot sign" observed under dermoscopyChen, Yuan ; Li, Lina ; Zhang, Zhi ; Gao, Runyan ; Ran, Xin ; Sun, Jitong ; Zhang, Chaoliang ; Liu, Xinyao ; Ran, YupingSkin research and technology : official journal of International Society for Bioengineering and the Skin (ISBS) [and] International Society for Digital Imaging of Skin (ISDIS) [and] International Society for Skin Imaging (ISSI), 2024, Vol.30 (6), p.e13775-e13775Texto completo disponível |
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10 |
Material Type: Report
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Allergic contact dermatitis to zinc caused by silver ring splint: Exposure assessment with scanning electron microscopeBratteland, Nerea M A ; Ervik, Torun K ; Alfonso, Jose HContact dermatitis, 2024Texto completo disponível |