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Transmission Electron Microscopy: A Textbook for Materials Science
Transmission Electron Microscopy: A Textbook for Materials Science
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Transmission Electron Microscopy: A Textbook for Materials Science

Williams, David B ; Carter, C. Barry

New York, NY: Springer 1996

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2
NCO–, a Key Fragment Upon Dissociative Electron Attachment and Electron Transfer to Pyrimidine Bases: Site Selectivity for a Slow Decay Process
NCO–, a Key Fragment Upon Dissociative Electron Attachment and Electron Transfer to Pyrimidine Bases: Site Selectivity for a Slow Decay Process
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NCO–, a Key Fragment Upon Dissociative Electron Attachment and Electron Transfer to Pyrimidine Bases: Site Selectivity for a Slow Decay Process

da Silva, Filipe Ferreira ; Matias, Carolina ; Almeida, Diogo ; García, Gustavo ; Ingólfsson, Oddur ; Flosadóttir, Helga Dögg ; Ómarsson, Benedikt ; Ptasinska, Sylwia ; Puschnigg, Benjamin ; Scheier, Paul ; Limão-Vieira, Paulo ; Denifl, Stephan

Journal of the American Society for Mass Spectrometry, 2013-11, Vol.24 (11), p.1787-1797 [Periódico revisado por pares]

Boston: Springer US

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3
Characterization of deformation structures in P-22 Cr–Mo steel through electron backscatter diffraction and transmission electron microscopy
Characterization of deformation structures in P-22 Cr–Mo steel through electron backscatter diffraction and transmission electron microscopy
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Characterization of deformation structures in P-22 Cr–Mo steel through electron backscatter diffraction and transmission electron microscopy

Bhattacharyya, Dhriti ; Drew, Michael ; Humphries, S. R. ; Payten, Warwick

Journal of materials science, 2023-07, Vol.58 (27), p.11286-11309 [Periódico revisado por pares]

New York: Springer US

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4
Revealing momentum-dependent electron–phonon and phonon–phonon coupling in complex materials with ultrafast electron diffuse scattering
Revealing momentum-dependent electron–phonon and phonon–phonon coupling in complex materials with ultrafast electron diffuse scattering
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Revealing momentum-dependent electron–phonon and phonon–phonon coupling in complex materials with ultrafast electron diffuse scattering

Dürr, Hermann A. ; Ernstorfer, Ralph ; Siwick, Bradley J.

MRS bulletin, 2021, Vol.46 (8), p.731-737 [Periódico revisado por pares]

Cham: Springer International Publishing

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5
Two-dimensional MXene nanosheets (types Ti3C2Tx and Ti2CTx) as new ion-to-electron transducers in solid-contact calcium ion-selective electrodes
Two-dimensional MXene nanosheets (types Ti3C2Tx and Ti2CTx) as new ion-to-electron transducers in solid-contact calcium ion-selective electrodes
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Two-dimensional MXene nanosheets (types Ti3C2Tx and Ti2CTx) as new ion-to-electron transducers in solid-contact calcium ion-selective electrodes

Shao, Yuzhou ; Yao, Yao ; Jiang, Chengmei ; Zhao, Fengnian ; Liu, Xiaoxue ; Ying, Yibin ; Ping, Jianfeng

Mikrochimica acta (1966), 2019-12, Vol.186 (12), p.750-750, Article 750 [Periódico revisado por pares]

Vienna: Springer Vienna

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6
Creep Behavior of a High-γ′ Ni-Based Superalloy Fabricated via Electron Beam Melting
Creep Behavior of a High-γ′ Ni-Based Superalloy Fabricated via Electron Beam Melting
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Creep Behavior of a High-γ′ Ni-Based Superalloy Fabricated via Electron Beam Melting

Fernandez-Zelaia, Patxi ; Acevedo, Obed D. ; Kirka, Michael M. ; Leonard, Donovan ; Yoder, Sean ; Lee, Yousub

Metallurgical and materials transactions. A, Physical metallurgy and materials science, 2021-02, Vol.52 (2), p.574-590 [Periódico revisado por pares]

New York: Springer US

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7
Modern Scanning Electron Microscopy. 3. Electron Probe
Modern Scanning Electron Microscopy. 3. Electron Probe
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Modern Scanning Electron Microscopy. 3. Electron Probe

Novikov, Yu. A.

Surface investigation, x-ray, synchrotron and neutron techniques, 2024-02, Vol.18 (1), p.185-209 [Periódico revisado por pares]

Moscow: Pleiades Publishing

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8
Strategies to overcome electron-beam issues in liquid phase TEM: Study of chemical processes
Strategies to overcome electron-beam issues in liquid phase TEM: Study of chemical processes
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Strategies to overcome electron-beam issues in liquid phase TEM: Study of chemical processes

Zheng, Wenjing ; Lee, Daewon ; Zheng, Haimei

MRS bulletin, 2024-03, Vol.49 (3), p.205-213 [Periódico revisado por pares]

Cham: Springer International Publishing

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9
Role of Electron–Ion Dissociative Recombination in CH4 Microwave Plasma on Basis of Simulations and Measurements of Electron Energy
Role of Electron–Ion Dissociative Recombination in CH4 Microwave Plasma on Basis of Simulations and Measurements of Electron Energy
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Role of Electron–Ion Dissociative Recombination in CH4 Microwave Plasma on Basis of Simulations and Measurements of Electron Energy

Minea, T. ; van de Steeg, A. W. ; Wolf, B. ; da Silva, A. S. ; Peeters, F. J. J. ; van den Bekerom, D. C. M. ; Butterworth, T. ; Ong, Q. ; van de Sanden, M. C. M. ; van Rooij, G. J.

Plasma chemistry and plasma processing, 2019-09, Vol.39 (5), p.1275-1289 [Periódico revisado por pares]

New York: Springer US

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10
Consequences of one-electron oxidation and one-electron reduction for 4-aminopyrimidine—DFT studies
Consequences of one-electron oxidation and one-electron reduction for 4-aminopyrimidine—DFT studies
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Consequences of one-electron oxidation and one-electron reduction for 4-aminopyrimidine—DFT studies

Raczyńska, Ewa D. ; Kolczyńska, Katarzyna ; Stępniewski, Tomasz M.

Journal of molecular modeling, 2012-08, Vol.18 (8), p.3523-3533 [Periódico revisado por pares]

Berlin/Heidelberg: Springer-Verlag

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