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Material Type: magazinearticle
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PUMPING ELECTRONSSchmidt, DavidYachting (New York, N.Y.), 2023-08, Vol.234 (2), p.62-62New York: Bonnier CorporationTexto completo disponível |
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Material Type: magazinearticle
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TRACKING ELECTRONS: ACS MEETING NEWS: Attosecond science opens the door to real-time observation and control of electron dynamicsKEMSLEY, JYLLIANChemical & Engineering News Archive, 2009-04, Vol.87 (15), p.50-51Texto completo disponível |
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Material Type: magazinearticle
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EYEING ELECTRONS: MOLECULAR DYNAMICS: Laser pulse enables tracking of electron distribution in reactionsKEMSLEY, JYLLIANChemical & Engineering News Archive, 2009-03, Vol.87 (11), p.8Texto completo disponível |
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Material Type: magazinearticle
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Soft Errors Induced by High-Energy ElectronsGadlage, Matthew J. ; Roach, Austin H. ; Duncan, Adam R. ; Williams, Aaron M. ; Bossev, Dobrin P. ; Kay, Matthew J.IEEE transactions on device and materials reliability, 2017-03, Vol.17 (1), p.157-162 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: magazinearticle
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Electron ElectionBaum, Rudy MChemical & Engineering News, 2014-11, Vol.92 (45), p.3Washington: American Chemical SocietyTexto completo disponível |
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Material Type: magazinearticle
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Killer electronsAstronomy (Milwaukee), 2017-02, Vol.45 (2), p.13-13Kalmbach Publishing CompanyTexto completo disponível |
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Material Type: magazinearticle
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ELECTRoNS UNPLUGGEDSchneider, DavidIEEE spectrum, 2010-05, Vol.47 (5), p.34New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Texto completo disponível |
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Material Type: magazinearticle
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TRACKING ELECTRONSKemsley, JyllianChemical & Engineering News, 2009-04, Vol.87 (15), p.50Washington: American Chemical SocietyTexto completo disponível |
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Material Type: magazinearticle
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EYEING ELECTRONSKemsley, JyllianChemical & Engineering News, 2009-03, Vol.87 (11), p.8Washington: American Chemical SocietyTexto completo disponível |
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Material Type: magazinearticle
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