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1 |
Material Type: Artigo
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Development of fast scanning module with a novel bubble solution applied to scanning acoustic microscopy system for industrial nondestructive inspectionPham, Van Hiep ; Vo, Tan Hung ; Vu, Dinh Dat ; Choi, Jaeyeop ; Park, Sumin ; Mondal, Sudip ; Lee, Byeong-il ; Oh, JunghwanExpert systems with applications, 2023-10, Vol.228, p.120273, Article 120273 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
2 |
Material Type: Artigo
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Automated visual inspection in the semiconductor industry: A surveyHuang, Szu-Hao ; Pan, Ying-ChengComputers in industry, 2015-01, Vol.66, p.1-10 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
3 |
Material Type: Artigo
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Optimal periodic and random inspections with first, last and overtime policiesZhao, Xufeng ; Nakagawa, ToshioInternational journal of systems science, 2015-07, Vol.46 (9), p.1648-1660 [Periódico revisado por pares]Taylor & FrancisTexto completo disponível |
4 |
Material Type: Artigo
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Economic production lot sizing under imperfect quality, on-line inspection, and inspection errors: Full vs. sampling inspectionBose, Dipankar ; Guha, ApratimComputers & industrial engineering, 2021-10, Vol.160, p.107565, Article 107565 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
5 |
Material Type: Artigo
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Evaluation and Enhancement of Resolution-Aware Coverage Path Planning Method for Surface Inspection Using Unmanned Aerial VehiclesWu, Weitong ; Funabora, Yuki ; Doki, Shinji ; Doki, Kae ; Yoshikawa, Satoru ; Mitsuda, Tetsuji ; Xiang, JingyuIEEE access, 2024, Vol.12, p.16753-16766 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
6 |
Material Type: Artigo
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Sweep scan path planning for five-axis inspection of free-form surfacesZhang, Yang ; Zhou, Zi ; Tang, KaiRobotics and computer-integrated manufacturing, 2018-02, Vol.49, p.335-348 [Periódico revisado por pares]Oxford: Elsevier LtdTexto completo disponível |
7 |
Material Type: Artigo
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Unmanned Aerial Vehicles (UAVs): A Survey on Civil Applications and Key Research ChallengesShakhatreh, Hazim ; Sawalmeh, Ahmad H. ; Al-Fuqaha, Ala ; Dou, Zuochao ; Almaita, Eyad ; Khalil, Issa ; Othman, Noor Shamsiah ; Khreishah, Abdallah ; Guizani, MohsenIEEE access, 2019, Vol.7, p.48572-48634 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
8 |
Material Type: Livro
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Computer vision technology for food quality evaluationSun, Da-WenAmsterdam: Elsevier/Academic Press 2008Texto completo disponível |
9 |
Material Type: Artigo
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Importance Measure for Multilevel Inspections of Multistate Systems: A Value of Information PerspectiveZhang, Boyuan ; Liu, Yu ; Xiahou, TangfanIEEE transactions on reliability, 2024-06, Vol.73 (2), p.885-901 [Periódico revisado por pares]New York: IEEETexto completo disponível |
10 |
Material Type: Artigo
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Condition-Based Maintenance Planning for Systems Subject to Dependent Soft and Hard FailuresHu, Jiawen ; Sun, Qiuzhuang ; Ye, Zhi-ShengIEEE transactions on reliability, 2021-12, Vol.70 (4), p.1468-1480 [Periódico revisado por pares]New York: IEEETexto completo disponível |