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1
Correlating pattern grime and quality attributes
Correlating pattern grime and quality attributes
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Artigo 		Adicionar ao Meu Espaço

Correlating pattern grime and quality attributes

Daniel Feitosa Apostolos Ampatzoglou; Paris Avgeriou; Elisa Yumi Nakagawa

IEEE Access Piscataway v. 6, p. 23065-23078, 2018

Piscataway 2018

Localização: ICMC - Inst. Ciên. Mat. Computação    (PROD 2888073 )(Acessar)

2
Investigating the effect of design patterns on energy consumption
Investigating the effect of design patterns on energy consumption
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Artigo 		Adicionar ao Meu Espaço

Investigating the effect of design patterns on energy consumption

Daniel Feitosa Rutger Alders; Apostolos Ampatzoglou; Paris Avgeriou; Elisa Yumi Nakagawa

Journal of Software: Evolution and Process Malden : John Wiley and Sons v. 29, n. 2, p. 1851-1870, Dez. 2017

Malden 2017

Localização: ICMC - Inst. Ciên. Mat. Computação    (PROD 2837734 )(Acessar)

3
What can violations of good practices tell about the relationship between GoF patterns and run-time quality attributes?
What can violations of good practices tell about the relationship between GoF patterns and run-time quality attributes?
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Artigo 		Adicionar ao Meu Espaço

What can violations of good practices tell about the relationship between GoF patterns and run-time quality attributes?

Daniel Feitosa Apostolos Ampatzoglou; Paris Avgeriou; Alexander Chatzigeorgiou; Elisa Yumi Nakagawa

Information and Software Technology Amsterdam : Elsevier v. 105, p. 1-16, Jan. 2019

Amsterdam 2019

Localização: ICMC - Inst. Ciên. Mat. Computação    (PROD 2930108 )(Acessar)

4
Investigating quality trade-offs in open source critical embedded systems
Investigating quality trade-offs in open source critical embedded systems
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Artigo de Congresso 		Adicionar ao Meu Espaço

Investigating quality trade-offs in open source critical embedded systems

Daniel Feitosa Apostolos Ampatzoglou; Paris Avgeriou; Elisa Yumi Nakagawa; International ACM Sigsoft Conference on the Quality of Software Architectures (11. 2015 Montreal, Canada)

Proceedings New York, NY : ACM, 2015

New York, NY ACM 2015

Localização: ICMC - Inst. Ciên. Mat. Computação    (PROD 2698806 )(Acessar)

5
The evolution of design pattern grime an industrial case study
The evolution of design pattern grime an industrial case study
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Artigo de Congresso 		Adicionar ao Meu Espaço

The evolution of design pattern grime an industrial case study

Daniel Feitosa Paris Avgeriou; Apostolos Ampatzoglou; Elisa Yumi Nakagawa; International Conference on Product-Focused Software Process Improvement - PROFES (18. 2017Cusco Innsbruck, Austria)

Lecture Notes in Computer Science Cham : Springer v. 10611, p. 165-181, 2017

Cham Springer 2017

Localização: ICMC - Inst. Ciên. Mat. Computação    (PROD 2877747 )(Acessar)

6
Design approaches for critical embedded systems a systematic mapping study
Design approaches for critical embedded systems a systematic mapping study
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Artigo de Congresso 		Adicionar ao Meu Espaço

Design approaches for critical embedded systems a systematic mapping study

Daniel Feitosa Apostolos Ampatzoglou; Paris Avgeriou; Frank José Affonso; Hugo Andrade; Katia Romero Felizardo; Elisa Yumi Nakagawa; International Conference on Evaluation of Novel Approaches to Software Engineering - ENASE (12. 2017 Porto)

Communications in Computer and Information Science - CCIS Cham : Springer, 2018 v. 866, p. 243-274

Cham Springer 2018

Localização: ICMC - Inst. Ciên. Mat. Computação    (PROD-2937447 )(Acessar)

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Deste Autor:

  1. Ampatzoglou, A
  2. Feitosa, D
  3. Avgeriou, P
  4. Nakagawa, E
  5. Andrade, H

Neste Assunto:

  1. Engenharia De Software
  2. Sistemas De Informação
  3. Design
  4. Arquitetura De Software
  5. Projeto De Software

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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