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1.55-μm InP-lattice-matched VCSELs with AlGaAsSb-AlAsSb DBRs
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1.55-μm InP-lattice-matched VCSELs with AlGaAsSb-AlAsSb DBRs

Nakagawa, S. ; Hall, E. ; Almuneau, G. ; Kim, J.K. ; Buell, D.A. ; Kroemer, H. ; Coldren, L.A.

IEEE journal of selected topics in quantum electronics, 2001-03, Vol.7 (2), p.224-230 [Periódico revisado por pares]

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2
Improved electrical and thermal properties of InP-AlGaAsSb Bragg mirrors for long-wavelength vertical-cavity lasers
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Improved electrical and thermal properties of InP-AlGaAsSb Bragg mirrors for long-wavelength vertical-cavity lasers

Almuneau, G. ; Hall, E. ; Mukaihara, T. ; Nakagawa, S. ; Luo, C. ; Clarke, D.R. ; Coldren, L.A.

IEEE photonics technology letters, 2000-10, Vol.12 (10), p.1322-1324

New York: IEEE

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3
InP-based all-epitaxial 1.3-μm VCSELs with selectively etched AlInAs apertures and Sb-based DBRs
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InP-based all-epitaxial 1.3-μm VCSELs with selectively etched AlInAs apertures and Sb-based DBRs

Asano, T. ; Feezell, D. ; Koda, R. ; Reddy, M.H.M. ; Buell, D.A. ; Huntington, A.S. ; Hall, E. ; Nakagawa, S. ; Coldren, L.A.

IEEE photonics technology letters, 2003-10, Vol.15 (10), p.1333-1335

IEEE

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4
Measurement and FEM analysis of magnetization loss in HTS tapes
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Measurement and FEM analysis of magnetization loss in HTS tapes

Miyamoto, K. ; Amemiya, N. ; Banno, N. ; Torii, M. ; Hatasa, E. ; Mizushima, E. ; Nakagawa, T. ; Mukai, H. ; Ohmatsu, K.

IEEE transactions on applied superconductivity, 1999-06, Vol.9 (2), p.770-773 [Periódico revisado por pares]

New York, NY: IEEE

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5
New fabrication process for Josephson tunnel junctions using photosensitive polyimide insulation layer for superconducting integrated circuits
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New fabrication process for Josephson tunnel junctions using photosensitive polyimide insulation layer for superconducting integrated circuits

Kikuchi, K. ; Segawa, S. ; Eun-Sil Jung ; Nakagawa, H. ; Tokoro, K. ; Itatani, H. ; Aoyagi, M.

IEEE transactions on applied superconductivity, 2003-06, Vol.13 (2), p.119-122 [Periódico revisado por pares]

New York, NY: IEEE

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