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Carrier dynamics at surface and interface in hydrogenated amorphous silicon observed by the transient grating method
Carrier dynamics at surface and interface in hydrogenated amorphous silicon observed by the transient grating method
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Carrier dynamics at surface and interface in hydrogenated amorphous silicon observed by the transient grating method

KOMURO, S ; AOYAGI, Y ; SEGAWA, Y ; NAMBA, S ; MASUYAMA, A ; OKAMOTO, H ; HAMAKAWA, Y

Applied physics letters, 1983-11, Vol.43 (10), p.968-970 [Periódico revisado por pares]

Melville, NY: American Institute of Physics

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