Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: magazinearticle
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Take care when charting patientsMason, Mitchell GRN, 2009-05, Vol.72 (5), p.8; author reply 8-8; author reply 8United States: UBM LLCTexto completo disponible |
2 |
Material Type: magazinearticle
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The Raspberry Pi single-board computer will revolutionise computer science teachingMitchell, G.Engineering & technology, 2012-04, Vol.7 (3), p.26-26Texto completo disponible |
3 |
Material Type: magazinearticle
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"MAKING WAR UPON THE MAP": The U.S. Army’s Forgotten Map Problem, Meade’s Gettysburg Campaign, and Depicting Operational ArtBruscino, Thomas ; Klingenberg, Mitchell G.Army history, 2024-04 (131), p.36-62U.S. Army Center of Military HistoryTexto completo disponible |
4 |
Material Type: magazinearticle
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For and againstMitchell, G. ; Clapperton, G.Engineering & technology, 2013-08, Vol.8 (7), p.26-27Texto completo disponible |
5 |
Material Type: magazinearticle
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For and againstArmitt, J. ; Mitchell, G.Engineering & technology, 2012, Vol.7 (7), p.26Texto completo disponible |
6 |
Material Type: magazinearticle
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Shifting roles: a positive trend.(Letter to the editor)Mitchell, G. PatDistrict administration, 2009-11, Vol.45 (10), p.8Professional Media Group LLCTexto completo disponible |
7 |
Material Type: magazinearticle
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Flight safetyThe Combat edge, 2013-09, Vol.22 (2), p.21Langley AFB: U.S. Department of the Air ForceTexto completo disponible |
8 |
Material Type: magazinearticle
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After flight attendant Jane Mitchell told Kenny G of her daughter's brain cancer diagnosis, the Grammy-winning saxophonist was a surprise visitor to Delta Air Lines' annual cancer fundraiser, the Delta Jet DragWorkforce (Oakland, Calif. 2013), 2017-07, Vol.96 (4), p.4MediaTec Publishing, IncTexto completo disponible |
9 |
Material Type: magazinearticle
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For and againstBuchanan-Dunlop, J. ; Mitchell, G.Engineering & technology, 2012-01, Vol.6 (12), p.26-27Texto completo disponible |
10 |
Material Type: magazinearticle
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Secondary Electron Imaging in an Aberration-Corrected STEMMitchell, D. R. G. ; Casillas, G.Microscopy today, 2016-09, Vol.24 (5), p.22-27New York, USA: Cambridge University PressTexto completo disponible |