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Refinado por: Nome da Publicação: Journal Of Applied Physics remover
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Effect of sample size on deformation in amorphous metals
Effect of sample size on deformation in amorphous metals
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Effect of sample size on deformation in amorphous metals

Volkert, C. A. ; Donohue, A. ; Spaepen, F.

Journal of applied physics, 2008-04, Vol.103 (8), p.083539-083539-6 [Periódico revisado por pares]

American Institute of Physics

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2
Kinetics of crystal nucleation in undercooled droplets of Sb- and Te-based alloys used for phase change recording
Kinetics of crystal nucleation in undercooled droplets of Sb- and Te-based alloys used for phase change recording
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Kinetics of crystal nucleation in undercooled droplets of Sb- and Te-based alloys used for phase change recording

Kalb, J. A. ; Spaepen, F. ; Wuttig, M.

Journal of applied physics, 2005-09, Vol.98 (5), p.054910-054910-7 [Periódico revisado por pares]

American Institute of Physics

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3
Calorimetric measurements of phase transformations in thin films of amorphous Te alloys used for optical data storage
Calorimetric measurements of phase transformations in thin films of amorphous Te alloys used for optical data storage
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Calorimetric measurements of phase transformations in thin films of amorphous Te alloys used for optical data storage

Kalb, J. ; Spaepen, F. ; Wuttig, M.

Journal of applied physics, 2003-03, Vol.93 (5), p.2389-2393 [Periódico revisado por pares]

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4
Viscosity and elastic constants of thin films of amorphous Te alloys used for optical data storage
Viscosity and elastic constants of thin films of amorphous Te alloys used for optical data storage
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Viscosity and elastic constants of thin films of amorphous Te alloys used for optical data storage

Kalb, J. ; Spaepen, F. ; Leervad Pedersen, T. P. ; Wuttig, M.

Journal of applied physics, 2003-10, Vol.94 (8), p.4908-4912 [Periódico revisado por pares]

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5
Simple model for interface stresses with application to misfit dislocation generation in epitaxial thin films
Simple model for interface stresses with application to misfit dislocation generation in epitaxial thin films
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Simple model for interface stresses with application to misfit dislocation generation in epitaxial thin films

Cammarata, R. C. ; Sieradzki, K. ; Spaepen, F.

Journal of applied physics, 2000-02, Vol.87 (3), p.1227-1234 [Periódico revisado por pares]

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6
Analysis of calorimetric measurements of grain growth
Analysis of calorimetric measurements of grain growth
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Analysis of calorimetric measurements of grain growth

CHEN, L. C ; SPAEPEN, F

Journal of applied physics, 1991-01, Vol.69 (2), p.679-688 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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7
Bulk and interface stresses in silver-nickel multilayered thin films
Bulk and interface stresses in silver-nickel multilayered thin films
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Bulk and interface stresses in silver-nickel multilayered thin films

RUUD, J. A ; WITVROUW, A ; SPAEPEN, F

Journal of applied physics, 1993-08, Vol.74 (4), p.2517-2523 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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8
Nanoindentation of Ag/Ni multilayered thin films
Nanoindentation of Ag/Ni multilayered thin films
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Nanoindentation of Ag/Ni multilayered thin films

Ruud, J. A. ; Jervis, T. R. ; Spaepen, F.

Journal of applied physics, 1994-05, Vol.75 (10), p.4969-4974 [Periódico revisado por pares]

United States

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9
Calorimetric studies of crystallization and relaxation of amorphous Si and Ge prepared by ion implantation
Calorimetric studies of crystallization and relaxation of amorphous Si and Ge prepared by ion implantation
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Calorimetric studies of crystallization and relaxation of amorphous Si and Ge prepared by ion implantation

DONOVAN, E. P ; SPAEPEN, F ; TURNBULL, D ; POATE, J. M ; JACOBSON, D. C

Journal of applied physics, 1985-01, Vol.57 (6), p.1795-1804 [Periódico revisado por pares]

Woodbury, NY: American Institute of Physics

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10
The effect of deposition rate on the intrinsic stress in copper and silver thin films
The effect of deposition rate on the intrinsic stress in copper and silver thin films
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The effect of deposition rate on the intrinsic stress in copper and silver thin films

Del Vecchio, A. L. ; Spaepen, F.

Journal of applied physics, 2007-03, Vol.101 (6), p.063518-063518-9 [Periódico revisado por pares]

American Institute of Physics

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