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Material Type: Artículo
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Ultrafast Laser Patterning of Metals Commonly Used in Medical Industry: Surface Roughness Control with Energy Gradient Pulse SequencesLeggio, Luca ; Di Maio, Yoan ; Pascale-Hamri, Alina ; Egaud, Gregory ; Reynaud, Stephanie ; Sedao, Xxx ; Mauclair, CyrilMicromachines (Basel), 2023-01, Vol.14 (2), p.251 [Revista revisada por pares]Switzerland: MDPI AGTexto completo disponible |
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Material Type: Artículo
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Proactive Control in the Stroop Task: A Conflict-Frequency Manipulation Free of Item-Specific, Contingency-Learning, and Color-Word Correlation ConfoundsSpinelli, Giacomo ; Lupker, Stephen J. Bugg, Julie M ; Benjamin, Aaron S ; Egner, TobiasJournal of experimental psychology. Learning, memory, and cognition, 2021-10, Vol.47 (10), p.1550-1562 [Revista revisada por pares]United States: American Psychological AssociationTexto completo disponible |
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Material Type: Artículo
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Continuation of Time Bounds for a Regularized Boussinesq SystemMammeri, Y.Acta applicandae mathematicae, 2012-02, Vol.117 (1), p.1-13 [Revista revisada por pares]Dordrecht: Springer NetherlandsTexto completo disponible |
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Material Type: Artículo
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Symmetry Classification of Third-Order Nonlinear Evolution Equations. Part I: Semi-simple AlgebrasBasarab-Horwath, P. ; Güngör, F. ; Lahno, V.Acta applicandae mathematicae, 2013-04, Vol.124 (1), p.123-170 [Revista revisada por pares]Dordrecht: Springer NetherlandsTexto completo disponible |
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Material Type: Artículo
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Internal defect and process parameter analysis during friction stir welding of Al 6061 sheetsRamulu, P. Janaki ; Narayanan, R. Ganesh ; Kailas, Satish V. ; Reddy, JayachandraInternational journal of advanced manufacturing technology, 2013-04, Vol.65 (9-12), p.1515-1528 [Revista revisada por pares]London: Springer-VerlagTexto completo disponible |
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6 |
Material Type: Acta de Congreso
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Cybersecurity Maturity Model to Prevent Cyberattacks on Web Applications Based on ISO 27032 and NISTArenas, Ethan ; Palomino, Juan ; Mansilla, Juan-Pablo2023 IEEE XXX International Conference on Electronics, Electrical Engineering and Computing (INTERCON), 2023, p.1-8IEEESin texto completo |
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7 |
Material Type: Acta de Congreso
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Innovative scatterometry approach for self-aligned quadruple patterning (SAQP) process controlGunay-Demirkol, Anil ; Altamirano Sanchez, Efrain ; Heraud, Stephane ; Godny, Stephane ; Charley, Anne-Laure ; Leray, Philippe ; Urenski, Ronen ; Cohen, Oded ; Turovets, Igor ; Wolfling, Shay Ukraintsev, Vladimir A ; Sanchez, Martha ISPIE 2016Sin texto completo |
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8 |
Material Type: Acta de Congreso
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Probe microscopy for metrology of next generation devicesHumphris, Andrew D. L ; Zhao, Bin ; Bastard, David ; Bunday, Benjamin Ukraintsev, Vladimir A ; Sanchez, Martha ISPIE 2016Sin texto completo |
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9 |
Material Type: Acta de Congreso
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Smart System with Infrared Thermography for Diagnostics of Batteries' Technical ConditionStoynova, Anna2021 XXX International Scientific Conference Electronics (ET), 2021, p.1-4IEEESin texto completo |
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10 |
Material Type: Acta de Congreso
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Directional Sensing of \text with Catalytic SensorsMateev, Valentin ; Marinova, Iliana2021 XXX International Scientific Conference Electronics (ET), 2021, p.1-4IEEESin texto completo |