skip to main content
Idioma:
Resultados 1 2 3 4 5 next page
Mostrar Somente
Refinado por: assunto: Engineering, Electrical & Electronic remover assunto: Physical Sciences remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Model-Free Adaptive Iterative Learning Control Method for the Czochralski Silicon Monocrystalline Batch Process
Model-Free Adaptive Iterative Learning Control Method for the Czochralski Silicon Monocrystalline Batch Process
Material Type:
Artigo 		Adicionar ao Meu Espaço

Model-Free Adaptive Iterative Learning Control Method for the Czochralski Silicon Monocrystalline Batch Process

Ren, Jun-Chao ; Liu, Ding ; Wan, Yin

IEEE transactions on semiconductor manufacturing, 2021-08, Vol.34 (3), p.398-407 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
2
An Investigation of Edge Bead Removal Width Variability, Effects and Process Control in Photolithographic Manufacturing
An Investigation of Edge Bead Removal Width Variability, Effects and Process Control in Photolithographic Manufacturing
Material Type:
Artigo 		Adicionar ao Meu Espaço

An Investigation of Edge Bead Removal Width Variability, Effects and Process Control in Photolithographic Manufacturing

Reiter, Tamas ; McCann, Michael ; Connolly, James ; Haughey, Sean

IEEE transactions on semiconductor manufacturing, 2022-02, Vol.35 (1), p.60-66 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
3
GAGAN: Global Attention Generative Adversarial Networks for Semiconductor Advanced Process Control
GAGAN: Global Attention Generative Adversarial Networks for Semiconductor Advanced Process Control
Material Type:
Artigo 		Adicionar ao Meu Espaço

GAGAN: Global Attention Generative Adversarial Networks for Semiconductor Advanced Process Control

Hsiao, Hsiu-Hui ; Wang, Kung-Jeng

IEEE transactions on semiconductor manufacturing, 2024-02, Vol.37 (1), p.115-123 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
4
Hierarchical Equipment Health Index Framework
Hierarchical Equipment Health Index Framework
Material Type:
Artigo 		Adicionar ao Meu Espaço

Hierarchical Equipment Health Index Framework

Lee, Chia-Yen ; Dong, Zhao-Hong

IEEE transactions on semiconductor manufacturing, 2019-08, Vol.32 (3), p.267-276 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
5
Wearable Epileptic Seizure Prediction System with Machine-Learning-Based Anomaly Detection of Heart Rate Variability
Wearable Epileptic Seizure Prediction System with Machine-Learning-Based Anomaly Detection of Heart Rate Variability
Material Type:
Artigo 		Adicionar ao Meu Espaço

Wearable Epileptic Seizure Prediction System with Machine-Learning-Based Anomaly Detection of Heart Rate Variability

Yamakawa, Toshitaka ; Miyajima, Miho ; Fujiwara, Koichi ; Kano, Manabu ; Suzuki, Yoko ; Watanabe, Yutaka ; Watanabe, Satsuki ; Hoshida, Tohru ; Inaji, Motoki ; Maehara, Taketoshi

Sensors (Basel, Switzerland), 2020-07, Vol.20 (14), p.3987 [Periódico revisado por pares]

Switzerland: MDPI AG

Texto completo disponível

Citações Citado por
6
A Statistical Approach to Detect Jamming Attacks in Wireless Sensor Networks
A Statistical Approach to Detect Jamming Attacks in Wireless Sensor Networks
Material Type:
Artigo 		Adicionar ao Meu Espaço

A Statistical Approach to Detect Jamming Attacks in Wireless Sensor Networks

Osanaiye, Opeyemi ; Alfa, Attahiru S ; Hancke, Gerhard P

Sensors (Basel, Switzerland), 2018-05, Vol.18 (6), p.1691 [Periódico revisado por pares]

Switzerland: MDPI AG

Texto completo disponível

Citações Citado por
7
Big Data Capabilities Applied to Semiconductor Manufacturing Advanced Process Control
Big Data Capabilities Applied to Semiconductor Manufacturing Advanced Process Control
Material Type:
Artigo 		Adicionar ao Meu Espaço

Big Data Capabilities Applied to Semiconductor Manufacturing Advanced Process Control

Moyne, James ; Samantaray, Jamini ; Armacost, Michael

IEEE transactions on semiconductor manufacturing, 2016-11, Vol.29 (4), p.283-291 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
8
A Survey on the Application of WirelessHART for Industrial Process Monitoring and Control
A Survey on the Application of WirelessHART for Industrial Process Monitoring and Control
Material Type:
Artigo 		Adicionar ao Meu Espaço

A Survey on the Application of WirelessHART for Industrial Process Monitoring and Control

Devan, P. Arun Mozhi ; Hussin, Fawnizu Azmadi ; Ibrahim, Rosdiazli ; Bingi, Kishore ; Khanday, Farooq Ahmad

Sensors (Basel, Switzerland), 2021-07, Vol.21 (15), p.4951 [Periódico revisado por pares]

Basel: MDPI AG

Texto completo disponível

Citações Citado por
9
In-Mold Sensors for Injection Molding: On the Way to Industry 4.0
In-Mold Sensors for Injection Molding: On the Way to Industry 4.0
Material Type:
Artigo 		Adicionar ao Meu Espaço

In-Mold Sensors for Injection Molding: On the Way to Industry 4.0

Ageyeva, Tatyana ; Horváth, Szabolcs ; Kovács, József Gábor

Sensors (Basel, Switzerland), 2019-08, Vol.19 (16), p.3551 [Periódico revisado por pares]

Switzerland: MDPI AG

Texto completo disponível

Citações Citado por
10
Online Forest Disturbance Detection at the Sub-Annual Scale Using Spatial Context From Sparse Landsat Time Series
Online Forest Disturbance Detection at the Sub-Annual Scale Using Spatial Context From Sparse Landsat Time Series
Material Type:
Artigo 		Adicionar ao Meu Espaço

Online Forest Disturbance Detection at the Sub-Annual Scale Using Spatial Context From Sparse Landsat Time Series

Wu, Ling ; Liu, Xiangnan ; Liu, Meiling ; Yang, Jinghui ; Zhu, Lihong ; Zhou, Botian

IEEE transactions on geoscience and remote sensing, 2022, Vol.60, p.1-14 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
Resultados 1 2 3 4 5 next page

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

Mostrar Somente

  1. Recursos Online (3.491)
  2. Revistas revisadas por pares (2.123)

Refinar Meus Resultados

Tipo de Recurso 

  1. Artigos  (2.268)
  2. Anais de Congresso  (1.523)
  3. magazinearticle  (131)
  4. Book Chapters  (11)
  5. Livros  (7)
  6. Mais opções open sub menu

Data de Publicação 

De até
Refinar
  1. Antes de1980  (20)
  2. 1980Até1991  (202)
  3. 1992Até2002  (1.087)
  4. 2003Até2014  (1.120)
  5. Após 2014  (1.533)
  6. Mais opções open sub menu

Idioma 

  1. Japonês  (173)
  2. Alemão  (4)
  3. Russo  (1)
  4. Norueguês  (1)
  5. Mais opções open sub menu

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.