Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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Hardware Acceleration of Genetic Sequence AlignmentArram, J. ; Tsoi, K. H. ; Luk, Wayne ; Jiang, P.Reconfigurable Computing: Architectures, Tools and Applications, p.13-24 [Periódico revisado por pares]Berlin, Heidelberg: Springer Berlin HeidelbergTexto completo disponível |
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2 |
Material Type: Ata de Congresso
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An improved DFT based method for phasor estimation in fault scenariosDiniz de Oliveira, A. ; Silva, L. R. M. ; Martins, C. H. ; Aleixo, R. R. ; Duque, C. A. ; Cerqueira, A. S.2012 IEEE Power and Energy Society General Meeting, 2012, p.1-5IEEETexto completo disponível |
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3 |
Material Type: Ata de Congresso
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Low cost single-phase grid-tie generatorDias, Jose A. A. ; Diniz N, J. ; Almeida, A. P. H. L. ; dos Santos Junior, E. C. ; Rocha, Nady2013 IEEE Industry Applications Society Annual Meeting, 2013, p.1-6IEEETexto completo disponível |
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4 |
Material Type: Ata de Congresso
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Dynamically adapting BDI agents based on high-level user specificationsNunes, Ingrid ; Barbosa, Simone Diniz Junqueira ; de Lucena, Carlos J. P. Such, Jose Miguel ; Hattori, Hiromitsu ; Dechesne, Francien ; Mors, Adriaan ; Weyns, DannyAdvanced Agent Technology, 2011, Vol.7068, p.139-163 [Periódico revisado por pares]Berlin, Heidelberg: Springer-VerlagTexto completo disponível |
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5 |
Material Type: Ata de Congresso
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Deposition of Carbon Nanotubes on Silicon for Field Emission ApplicationDantas, Michel O. ; Galeazzo, Elisabete ; Peres, Henrique E. ; Ramirez-Fernandez, Francisco J. ; Diniz, Eric ; Castro, Ricardo H.ECS transactions, 2009, Vol.23 (1), p.135-141Texto completo disponível |
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6 |
Material Type: Ata de Congresso
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Junctionless Fabrication on SOI Wafers Using Focused Ion Beam Milling and Al DiffusionLima, L.P. B. ; dos Santos, M.V. P. ; Cioldin, F. H. ; Diniz, J. A. ; Doi, I. ; Fo, J. GodoyECS transactions, 2012, Vol.49 (1), p.367-374Texto completo disponível |
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7 |
Material Type: Ata de Congresso
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Investigation of Thermal Stability of Titanium Nitride Using A RTA ProcessCioldin, F. H. ; Lima, L.P. B. ; Doi, I. ; Diniz, J. A. ; Godoy Filho, J. ; Zambotti, E. A.ECS transactions, 2012, Vol.49 (1), p.407-413Texto completo disponível |
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8 |
Material Type: Ata de Congresso
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The Influence of Poly-Si/SiGe Gate in Threshold, Sub-Threshold Parameters and Low Frequency Noise in p-MOSFETsJimenez Grados, Hugo R. ; Manera, Leandro T. ; Rautemberg Finardi, Márcia ; Alexandre Diniz, José ; Doi, Ioshiaki ; Jurgen Tatsch, Peter ; Enrique Figueroa, Hugo ; W. Swart, JacobusECS transactions, 2009, Vol.23 (1), p.371-380Texto completo disponível |
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9 |
Material Type: Ata de Congresso
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Tantalum Nitride as Promissing Gate Electrode for MOS TechnologyLima, L. ; Moreira, Milena ; Cioldin, F. ; Diniz, J. A. ; Doi, I.ECS transactions, 2010, Vol.31 (1), p.319Texto completo disponível |
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10 |
Material Type: Ata de Congresso
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Enhanced digital polarization demultiplexation via CMA step size adaptation for PM-QPSK coherent receiversRibeiro, V. B. ; Oliveira, J. C. R. F. ; Diniz, J. C. M. ; Rosa, E. S. ; Silva, R. ; Silva, E. P. ; Carvalho, L. H. ; Bordonalli, A. C.OFC/NFOEC, 2012, p.1-3IEEETexto completo disponível |