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Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent sourceMoxham, Thomas E. J. ; Laundy, David ; Dhamgaye, Vishal ; Fox, Oliver J. L. ; Sawhney, Kawal ; Korsunsky, Alexander M.Applied physics letters, 2021-03, Vol.118 (10) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |