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Material Type: Artigo
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Fabrication of nanostructures using a UV-based imprint techniqueBender, M. ; Otto, M. ; Hadam, B. ; Vratzov, B. ; Spangenberg, B. ; Kurz, H.Microelectronic engineering, 2000-06, Vol.53 (1), p.233-236 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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Material Type: Artigo
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Modular parallel-plate THz components for cost-efficient biosensing systemsNagel, M ; Haring Bolivar, P ; Kurz, HSemiconductor science and technology, 2005-07, Vol.20 (7), p.S281-S285 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Lateral phase change random access memory cell design for low power operationMERGET, F ; KIM, D. H ; HARING BOLIVAR, P ; KURZ, HMicrosystem technologies, 2007-01, Vol.13 (2), p.169-172 [Periódico revisado por pares]Berlin: SpringerTexto completo disponível |
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Material Type: Artigo
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Hot-phonon temperature and lifetime in biased boron-implanted SiO2/Si/SiO2 channelsLiberis, J ; Matulioniene, I ; Matulionis, A ; Lemme, M C ; Kurz, H ; Först, MSemiconductor science and technology, 2006-06, Vol.21 (6), p.803-807 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Tungsten work function engineering for dual metal gate nano-CMOSEFAVI, J. K ; MOLLENHAUER, T ; WAHLBRINK, T ; GOTTLOB, H. D. B ; LEMME, M. C ; KURZ, HJournal of materials science. Materials in electronics, 2005-07, Vol.16 (7), p.433-436 [Periódico revisado por pares]Norwell, MA: SpringerTexto completo disponível |
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Material Type: Artigo
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Improvements of AE technique using wavelet algorithms, coherence functions and automatic data analysisGrosse, Christian U. ; Finck, Florian ; Kurz, Jochen H. ; Reinhardt, Hans W.Construction & building materials, 2004-04, Vol.18 (3), p.203-213 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
7 |
Material Type: Artigo
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Cell-Laden and Cell-Free Biopolymer Hydrogel for the Treatment of Osteochondral Defects in a Sheep ModelSchagemann, Jan C. ; Erggelet, Christoph ; Chung, Hsi-Wei ; Lahm, Andreas ; Kurz, Haymo ; Mrosek, Eike H.Tissue engineering. Part A, 2009-01, Vol.15 (1), p.75-82 [Periódico revisado por pares]United States: Mary Ann Liebert, IncTexto completo disponível |
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Material Type: Artigo
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Femtosecond spectroscopy of hot carrier relaxation in bulk semiconductorsKurz, HSemiconductor science and technology, 1992-03, Vol.7 (3B), p.B124-B129 [Periódico revisado por pares]BRISTOL: IOP PublishingTexto completo disponível |
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Material Type: Artigo
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NANOSIL network of excellence—silicon-based nanostructures and nanodevices for long-term nanoelectronics applicationsBalestra, F. ; Parker, E. ; Leadley, D. ; Mantl, S. ; Dubois, E. ; Engstrom, O. ; Clerc, R. ; Cristoloveanu, S. ; Kurz, H. ; Raskin, J.P. ; Lemme, M. ; Ionescu, A. ; Moselund, K.E. ; Boucart, K. ; Kasper, E. ; Karmous, A. ; Baus, M. ; Spangenberg, B. ; Ostling, M. ; Sangiorgi, E. ; Ghibaudo, G. ; Flandre, D.Materials science in semiconductor processing, 2008-10, Vol.11 (5), p.148-159 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
10 |
Material Type: Artigo
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Reliability considerations of NDT by probability of detection (POD) determination using ultrasound phased arrayKurz, Jochen H. ; Jüngert, Anne ; Dugan, Sandra ; Dobmann, Gerd ; Boller, ChristianEngineering failure analysis, 2013-12, Vol.35, p.609-617 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |