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1
The Generalized Contrast-to-Noise Ratio: A Formal Definition for Lesion Detectability
The Generalized Contrast-to-Noise Ratio: A Formal Definition for Lesion Detectability
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The Generalized Contrast-to-Noise Ratio: A Formal Definition for Lesion Detectability

Rodriguez-Molares, Alfonso ; Rindal, Ole Marius Hoel ; D'hooge, Jan ; Masoy, Svein-Erik ; Austeng, Andreas ; Lediju Bell, Muyinatu A. ; Torp, Hans

IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2020-04, Vol.67 (4), p.745-759 [Periódico revisado por pares]

United States: IEEE

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2
Real-Time Automatic Ejection Fraction and Foreshortening Detection Using Deep Learning
Real-Time Automatic Ejection Fraction and Foreshortening Detection Using Deep Learning
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Real-Time Automatic Ejection Fraction and Foreshortening Detection Using Deep Learning

Smistad, Erik ; Ostvik, Andreas ; Salte, Ivar Mjaland ; Melichova, Daniela ; Nguyen, Thuy Mi ; Haugaa, Kristina ; Brunvand, Harald ; Edvardsen, Thor ; Leclerc, Sarah ; Bernard, Olivier ; Grenne, Bjornar ; Lovstakken, Lasse

IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2020-12, Vol.67 (12), p.2595-2604 [Periódico revisado por pares]

United States: IEEE

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3
A 1-μW Radiation-Hard Front-End in a 0.18-μm CMOS Process for the MALTA2 Monolithic Sensor
A 1-μW Radiation-Hard Front-End in a 0.18-μm CMOS Process for the MALTA2 Monolithic Sensor
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A 1-μW Radiation-Hard Front-End in a 0.18-μm CMOS Process for the MALTA2 Monolithic Sensor

Piro, F. ; Allport, P. ; Asensi, I. ; Berdalovic, I. ; Bortoletto, D. ; Buttar, C. ; Cardella, R. ; Charbon, E. ; Dachs, F. ; Dao, V. ; Dobrijevic, D. ; Dyndal, M. ; Flores, L. ; Freeman, P. ; Gabrielli, A. ; Gonella, L. ; Kugathasan, T. ; LeBlanc, M. ; Oyulmaz, K. ; Pernegger, H. ; Riedler, P. ; van Rijnbach, M. ; Sandaker, H. ; Sharma, A. ; Solans, C. ; Snoeys, W. ; Suligoj, T. ; Torres, J. ; Worm, S.

IEEE transactions on nuclear science, 2022-06, Vol.69 (6), p.1299-1309 [Periódico revisado por pares]

New York: IEEE

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4
A Very Large Cardiac Channel Data Database (VLCD) used to Evaluate Global Image Coherence (GIC) as an In-Vivo Image Quality Metric
A Very Large Cardiac Channel Data Database (VLCD) used to Evaluate Global Image Coherence (GIC) as an In-Vivo Image Quality Metric
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A Very Large Cardiac Channel Data Database (VLCD) used to Evaluate Global Image Coherence (GIC) as an In-Vivo Image Quality Metric

Rindal, Ole Marius Hoel ; Bjastad, Tore Gruner ; Espeland, Torvald ; Berg, Erik Andreas Rye ; Masoy, Svein Erik

IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2023-10, Vol.70 (10), p.1-1 [Periódico revisado por pares]

New York: IEEE

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5
Signal Coherence and Image Amplitude With the Filtered Delay Multiply and Sum Beamformer
Signal Coherence and Image Amplitude With the Filtered Delay Multiply and Sum Beamformer
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Signal Coherence and Image Amplitude With the Filtered Delay Multiply and Sum Beamformer

Prieur, Fabrice ; Rindal, Ole Marius Hoel ; Austeng, Andreas

IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2018-07, Vol.65 (7), p.1133-1140 [Periódico revisado por pares]

United States: IEEE

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6
The effects of hydrogenation on the properties of heavy ion irradiated β-Ga2O3
The effects of hydrogenation on the properties of heavy ion irradiated β-Ga2O3
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The effects of hydrogenation on the properties of heavy ion irradiated β-Ga2O3

Polyakov, A. Y. ; Kuznetsov, A. ; Azarov, A. ; Miakonkikh, A. V. ; Chernykh, A. V. ; Vasilev, A. A. ; Shchemerov, I. V. ; Kochkova, A. I. ; Matros, N. R. ; Pearton, S. J.

Journal of materials science. Materials in electronics, 2023-05, Vol.34 (15), p.1201, Article 1201 [Periódico revisado por pares]

New York: Springer US

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7
Isotopic Enriched and Natural SiC Junction Barrier Schottky Diodes Under Heavy Ion Irradiation
Isotopic Enriched and Natural SiC Junction Barrier Schottky Diodes Under Heavy Ion Irradiation
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Isotopic Enriched and Natural SiC Junction Barrier Schottky Diodes Under Heavy Ion Irradiation

Roed, Ketil ; Eriksen, Dag Oistein ; Ceccaroli, Bruno ; Martinella, Corinna ; Javanainen, Arto ; Reshanov, Sergey ; Massetti, Silvia

IEEE transactions on nuclear science, 2022-07, Vol.69 (7), p.1675-1682 [Periódico revisado por pares]

New York: IEEE

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8
Longitudinal Direct Ionization Impact of Heavy Ions on See Testing for Ultrahigh Energies
Longitudinal Direct Ionization Impact of Heavy Ions on See Testing for Ultrahigh Energies
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Longitudinal Direct Ionization Impact of Heavy Ions on See Testing for Ultrahigh Energies

Wyrwoll, Vanessa ; Alia, Ruben Garcia ; Roed, Ketil ; Cazzaniga, Carlo ; Kastriotou, Maria ; Fernandez-Martinez, Pablo ; Coronetti, Andrea ; Cerutti, Francesco

IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1530-1539 [Periódico revisado por pares]

New York: IEEE

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9
Bulk In2O3 crystals grown by chemical vapour transport: a combination of XPS and DFT studies
Bulk In2O3 crystals grown by chemical vapour transport: a combination of XPS and DFT studies
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Bulk In2O3 crystals grown by chemical vapour transport: a combination of XPS and DFT studies

Zatsepin, D. A. ; Boukhvalov, D. W. ; Zatsepin, A. F. ; Vines, L. ; Gogova, D. ; Shur, V. Ya ; Esin, A. A.

Journal of materials science. Materials in electronics, 2019-10, Vol.30 (20), p.18753-18758 [Periódico revisado por pares]

New York: Springer US

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10
Influence of metal assisted chemical etching time period on mesoporous structure in as-cut upgraded metallurgical grade silicon for solar cell application
Influence of metal assisted chemical etching time period on mesoporous structure in as-cut upgraded metallurgical grade silicon for solar cell application
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Influence of metal assisted chemical etching time period on mesoporous structure in as-cut upgraded metallurgical grade silicon for solar cell application

Venkatesan, Ragavendran ; Mayandi, Jeyanthinath ; Pearce, Joshua M. ; Venkatachalapathy, Vishnukanthan

Journal of materials science. Materials in electronics, 2019-05, Vol.30 (9), p.8676-8685 [Periódico revisado por pares]

New York: Springer US

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